{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,2]],"date-time":"2026-06-02T08:03:47Z","timestamp":1780387427861,"version":"3.54.1"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2025,3,1]],"date-time":"2025-03-01T00:00:00Z","timestamp":1740787200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,3,1]],"date-time":"2025-03-01T00:00:00Z","timestamp":1740787200000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,3,1]],"date-time":"2025-03-01T00:00:00Z","timestamp":1740787200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,3,1]],"date-time":"2025-03-01T00:00:00Z","timestamp":1740787200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100007140","name":"Synopsys","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100007140","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["CNS-2310142"],"award-info":[{"award-number":["CNS-2310142"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2025,3]]},"DOI":"10.1109\/tcad.2024.3466810","type":"journal-article","created":{"date-parts":[[2024,9,23]],"date-time":"2024-09-23T17:27:49Z","timestamp":1727112469000},"page":"867-881","source":"Crossref","is-referenced-by-count":1,"title":["Enhancing Analog IC Security Using Randomized Obfuscation Circuits"],"prefix":"10.1109","volume":"44","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6738-805X","authenticated-orcid":false,"given":"Jayeeta","family":"Chaudhuri","sequence":"first","affiliation":[{"name":"School of Electrical, Computer, and Energy Engineering, Arizona State University, Tempe, AZ, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0002-4111-4648","authenticated-orcid":false,"given":"Mayukh","family":"Bhattacharya","sequence":"additional","affiliation":[{"name":"Custom Design Manufacturing Group, Synopsys, Sunnyvale, CA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4475-6435","authenticated-orcid":false,"given":"Krishnendu","family":"Chakrabarty","sequence":"additional","affiliation":[{"name":"School of Electrical, Computer, and Energy Engineering, Arizona State University, Tempe, AZ, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2335155"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VTS52500.2021.9794141"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-SoC.2017.8203496"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2017.2750088"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2016.7495588"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/3133956.3133985"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2019.8758633"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2017.8242064"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2020.3007159"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/HOST45689.2020.9300277"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2019.8758657"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TETC.2017.2740364"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-04138-9_26"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/2024724.2024805"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/2024724.2024799"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2017.7906739"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2019.8702671"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2021.3117584"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2021.3111550"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.23919\/DATE54114.2022.9774556"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/3560834.3563826"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2014.50"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2023.3296279"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2017.2710954"},{"key":"ref25","volume-title":"Gaussian process regressor","year":"2024"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/321062.321069"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/OPTIM.2010.5510353"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.eswa.2018.09.033"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ICCChinaW.2014.7107863"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.ejor.2008.02.018"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2020.2976734"},{"key":"ref32","volume-title":"Margin of error","author":"Survey","year":"2024"},{"key":"ref33","volume-title":"Adsbenchmark","year":"2024"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS48785.2022.9937936"},{"key":"ref35","volume-title":"HSPICE: The gold standard for accurate circuit simulation.","year":"2024"},{"key":"ref36","volume-title":"Custom compiler","year":"2024"},{"key":"ref37","volume-title":"Custom waveView","year":"2024"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/4235.996017"},{"key":"ref39","volume-title":"Johnson-nyquist noise","author":"Turner","year":"2012"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1117\/12.3010567"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielam\/43\/10896910\/10689372-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/43\/10896910\/10689372.pdf?arnumber=10689372","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T07:19:29Z","timestamp":1740122369000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10689372\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,3]]},"references-count":40,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2024.3466810","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,3]]}}}