{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,13]],"date-time":"2026-06-13T09:08:43Z","timestamp":1781341723361,"version":"3.54.1"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2025,6,1]],"date-time":"2025-06-01T00:00:00Z","timestamp":1748736000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,6,1]],"date-time":"2025-06-01T00:00:00Z","timestamp":1748736000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,6,1]],"date-time":"2025-06-01T00:00:00Z","timestamp":1748736000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Program of China","award":["2022YFB4400500"],"award-info":[{"award-number":["2022YFB4400500"]}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["92373207"],"award-info":[{"award-number":["92373207"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62104037"],"award-info":[{"award-number":["62104037"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Zhishan Young Scholar Support Program of Southeast University","award":["2242024RCB0052"],"award-info":[{"award-number":["2242024RCB0052"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2025,6]]},"DOI":"10.1109\/tcad.2024.3522199","type":"journal-article","created":{"date-parts":[[2024,12,23]],"date-time":"2024-12-23T14:19:18Z","timestamp":1734963558000},"page":"2378-2391","source":"Crossref","is-referenced-by-count":5,"title":["Dual Multimodal Fusions With Convolution and Transformer Layers for VLSI Congestion Prediction"],"prefix":"10.1109","volume":"44","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3110-2531","authenticated-orcid":false,"given":"Hao","family":"Gu","sequence":"first","affiliation":[{"name":"National ASIC System Engineering Research Center, School of Integrated Circuits, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Youwen","family":"Wang","sequence":"additional","affiliation":[{"name":"National ASIC System Engineering Research Center, School of Integrated Circuits, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Xinglin","family":"Zheng","sequence":"additional","affiliation":[{"name":"National ASIC System Engineering Research Center, School of Integrated Circuits, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Keyu","family":"Peng","sequence":"additional","affiliation":[{"name":"National ASIC System Engineering Research Center, School of Integrated Circuits, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9475-6364","authenticated-orcid":false,"given":"Ziran","family":"Zhu","sequence":"additional","affiliation":[{"name":"National ASIC System Engineering Research Center, School of Integrated Circuits, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1391-2696","authenticated-orcid":false,"given":"Jianli","family":"Chen","sequence":"additional","affiliation":[{"name":"State Key Laboratory of ASIC and System, Fudan University, Shanghai, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8379-0321","authenticated-orcid":false,"given":"Jun","family":"Yang","sequence":"additional","affiliation":[{"name":"National ASIC System Engineering Research Center, School of Integrated Circuits, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","first-page":"1","article-title":"Ripple 2.0: High quality routability-driven placement via global router integration","volume-title":"Proc. ACM\/IEEE Design Autom. Conf. (DAC)","author":"He"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2017.2712665"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2859220"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.23919\/DATE51398.2021.9473959"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364463"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/981066.981110"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2360453"},{"key":"ref8","first-page":"1","article-title":"Pin accessibility and routing congestion aware DRC hotspot prediction using graph neural network and U-Net","volume-title":"Proc. IEEE\/ACM Int. Conf. Comput.-Aided Design (ICCAD)","author":"Baek"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2022.3168259"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/3489517.3530675"},{"key":"ref11","first-page":"20313","article-title":"Versatile multi-stage graph neural network for circuit representation","volume-title":"Proc. 36th Adv. Neural Inf. Process. Syst.","volume":"35","author":"Yang"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD57390.2023.10323800"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/3240765.3240843"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/3316781.3317876"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-SoC.2019.8920342"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD51958.2021.9643446"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3093420"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/3292500.3330961"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.2102.04306"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2024.3373033"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-24574-4_28"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.48550\/ARXIV.1706.03762"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.00041"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/2717764.2723572"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2020.3003843"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2023.3287970"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2003.819861"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1145\/3373269"},{"key":"ref29","volume-title":"INNOVUS Implementation System, Version 20.1","year":"2020"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/DAC56929.2023.10247660"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2021.3053191"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TBDATA.2022.3177455"},{"key":"ref34","first-page":"441","article-title":"The \u2019K\u2019 in K-fold cross validation","volume-title":"Proc. Eur. Symp. Artif. Neural Netw. (ESANN)","author":"Anguita"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.2010.11929"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-01228-1_26"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/43\/11007940\/10813017.pdf?arnumber=10813017","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,21]],"date-time":"2025-11-21T18:43:14Z","timestamp":1763750594000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10813017\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,6]]},"references-count":36,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2024.3522199","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,6]]}}}