{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,17]],"date-time":"2026-04-17T22:42:07Z","timestamp":1776465727579,"version":"3.51.2"},"reference-count":10,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T00:00:00Z","timestamp":1751328000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T00:00:00Z","timestamp":1751328000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,7,1]],"date-time":"2025-07-01T00:00:00Z","timestamp":1751328000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["52277179"],"award-info":[{"award-number":["52277179"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Hubei Jiufengshan Laboratory"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2025,7]]},"DOI":"10.1109\/tcad.2025.3531252","type":"journal-article","created":{"date-parts":[[2025,1,17]],"date-time":"2025-01-17T18:36:47Z","timestamp":1737139007000},"page":"2832-2835","source":"Crossref","is-referenced-by-count":3,"title":["A Modeling Method of Reverse Biased Electric Field for JBS Diodes Based on Schwarz-Christoffel Transformation"],"prefix":"10.1109","volume":"44","author":[{"ORCID":"https:\/\/orcid.org\/0009-0008-8361-7116","authenticated-orcid":false,"given":"Yanqiu","family":"Li","sequence":"first","affiliation":[{"name":"School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5946-8407","authenticated-orcid":false,"given":"Zhiqiang","family":"Wang","sequence":"additional","affiliation":[{"name":"Department of Integrated Power Systems and Device Technology, Hubei Jiufengshan Laboratory, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7406-2867","authenticated-orcid":false,"given":"Kuan","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jun","family":"Yuan","sequence":"additional","affiliation":[{"name":"Department of Integrated Power Systems and Device Technology, Hubei Jiufengshan Laboratory, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2536-6346","authenticated-orcid":false,"given":"Guoqing","family":"Xin","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2418-9998","authenticated-orcid":false,"given":"Xiaojie","family":"Shi","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Huazhong University of Science and Technology, Wuhan, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/tie.2017.2652401"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2008.926638"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2014.2365519"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2011.06.002"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2016.2549599"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2011.05.013"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1063\/1.4987127"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1063\/1.3615846"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1007\/bf00877769"},{"key":"ref10","first-page":"272","volume-title":"Complex Variables and Applications","author":"Brown","year":"2009"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/43\/11044910\/10844860.pdf?arnumber=10844860","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,6,24]],"date-time":"2025-06-24T07:06:35Z","timestamp":1750748795000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10844860\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,7]]},"references-count":10,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2025.3531252","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,7]]}}}