{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,2]],"date-time":"2025-08-02T16:18:16Z","timestamp":1754151496680,"version":"3.41.2"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2025,8,1]],"date-time":"2025-08-01T00:00:00Z","timestamp":1754006400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,8,1]],"date-time":"2025-08-01T00:00:00Z","timestamp":1754006400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,8,1]],"date-time":"2025-08-01T00:00:00Z","timestamp":1754006400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Samsung Research Funding & Incubation Center of Samsung Electronics","award":["SRFCIT2102-06"],"award-info":[{"award-number":["SRFCIT2102-06"]}]},{"name":"Institute of Information and communications Technology Planning and Evaluation"},{"name":"Korea Government (MSIT) through Development of Memory Module and Memory Compiler for Nonvolatile PIM Optimized for Data Characteristics and Data Access Characteristics of AI Processor","award":["2025-11-0830"],"award-info":[{"award-number":["2025-11-0830"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2025,8]]},"DOI":"10.1109\/tcad.2025.3531337","type":"journal-article","created":{"date-parts":[[2025,1,17]],"date-time":"2025-01-17T13:36:47Z","timestamp":1737121007000},"page":"3099-3111","source":"Crossref","is-referenced-by-count":0,"title":["Bayesian Learning-Enhanced Embedded Memory Design With Automated Circuit Variant Generation"],"prefix":"10.1109","volume":"44","author":[{"ORCID":"https:\/\/orcid.org\/0009-0004-5146-825X","authenticated-orcid":false,"given":"Dongho","family":"Kim","sequence":"first","affiliation":[{"name":"Department of Electronic Engineering, Kwangwoon University, Seoul, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3302-1436","authenticated-orcid":false,"given":"Junseo","family":"Lee","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Kwangwoon University, Seoul, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-4171-4987","authenticated-orcid":false,"given":"Seokhun","family":"Kim","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Kwangwoon University, Seoul, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7298-653X","authenticated-orcid":false,"given":"Jihwan","family":"Park","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Kwangwoon University, Seoul, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1491-0625","authenticated-orcid":false,"given":"Sangheon","family":"Lee","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Kwangwoon University, Seoul, South Korea"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7346-6739","authenticated-orcid":false,"given":"Hanwool","family":"Jeong","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Kwangwoon University, Seoul, South Korea"}]}],"member":"263","reference":[{"volume-title":"28nm technology","year":"2024","key":"ref1"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/dac56929.2023.10247739"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/dac56929.2023.10247991"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.23919\/date48585.2020.9116200"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/dac56929.2023.10247941"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/icces51560.2020.9334576"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2021.3054811"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/dac18074.2021.9586306"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.23919\/date51398.2021.9474253"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/asp-dac47756.2020.9045614"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/3061639.3062234"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2023.3313874"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2012.6176988"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2015.2461592"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/access.2021.3070851"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/vtsa.2005.1497065"},{"key":"ref17","first-page":"9361","article-title":"Bayesian optimization for iterative learning","volume-title":"Proc. 34th Conf. Neural Inf. Process. Syst.","author":"Nguyen"},{"key":"ref18","article-title":"A tutorial on Bayesian optimization of expensive cost functions, with application to active user modeling and hierarchical reinforcement learning","author":"Brochu","year":"2010","journal-title":"arXiv:1012.2599"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-28650-9_4"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2016.04.009"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/vldi-dat.2013.6533820"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/smacd.2016.7520740"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/icm.2007.4497685"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2008.2001941"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/43\/11085011\/10844872.pdf?arnumber=10844872","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,7,19]],"date-time":"2025-07-19T04:55:22Z","timestamp":1752900922000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10844872\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,8]]},"references-count":24,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2025.3531337","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"type":"print","value":"0278-0070"},{"type":"electronic","value":"1937-4151"}],"subject":[],"published":{"date-parts":[[2025,8]]}}}