{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,11,27]],"date-time":"2025-11-27T19:06:05Z","timestamp":1764270365949,"version":"3.46.0"},"reference-count":8,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003052","name":"Ministry of Trade, Industry and Energy","doi-asserted-by":"publisher","award":["1415180306"],"award-info":[{"award-number":["1415180306"]}],"id":[{"id":"10.13039\/501100003052","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Korea Semiconductor Research Consortium (KSRC) Support Program for the Development of the Future Semiconductor Device","award":["20019164"],"award-info":[{"award-number":["20019164"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2025,9]]},"DOI":"10.1109\/tcad.2025.3549352","type":"journal-article","created":{"date-parts":[[2025,3,7]],"date-time":"2025-03-07T13:39:44Z","timestamp":1741354784000},"page":"3648-3652","source":"Crossref","is-referenced-by-count":0,"title":["Multistage Enhanced Diagnosis With Fault Candidate Reduction"],"prefix":"10.1109","volume":"44","author":[{"ORCID":"https:\/\/orcid.org\/0009-0007-6443-5918","authenticated-orcid":false,"given":"Hyojun","family":"Yun","sequence":"first","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Computer Systems Reliable SoC Laboratory, Yonsei University, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-8331-7684","authenticated-orcid":false,"given":"Hyeonchan","family":"Lim","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Computer Systems Reliable SoC Laboratory, Yonsei University, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6868-0829","authenticated-orcid":false,"given":"Hayoung","family":"Lee","sequence":"additional","affiliation":[{"name":"Department of Intelligence Semiconductor Engineering, Ajou University, Suwon, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7093-2095","authenticated-orcid":false,"given":"Sungho","family":"Kang","sequence":"additional","affiliation":[{"name":"Department of Electrical and Electronic Engineering, Computer Systems Reliable SoC Laboratory, Yonsei University, Seoul, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2006.297627"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-4919-2_11"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/54.606006"},{"volume-title":"TetraMAX ATPG User Guide","year":"2018","key":"ref4"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2256437"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2013.6651899"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2016.2611499"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2023.3336212"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/43\/11133574\/10916692.pdf?arnumber=10916692","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,11,27]],"date-time":"2025-11-27T18:58:05Z","timestamp":1764269885000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10916692\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,9]]},"references-count":8,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2025.3549352","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"type":"print","value":"0278-0070"},{"type":"electronic","value":"1937-4151"}],"subject":[],"published":{"date-parts":[[2025,9]]}}}