{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T23:19:13Z","timestamp":1780355953667,"version":"3.54.1"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["2349538"],"award-info":[{"award-number":["2349538"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["2401544"],"award-info":[{"award-number":["2401544"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2026,2]]},"DOI":"10.1109\/tcad.2025.3591409","type":"journal-article","created":{"date-parts":[[2025,7,21]],"date-time":"2025-07-21T18:08:44Z","timestamp":1753121324000},"page":"983-997","source":"Crossref","is-referenced-by-count":2,"title":["NeFT: Negative Feedback Training to Improve Robustness of Compute-in-Memory DNN Accelerators"],"prefix":"10.1109","volume":"45","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-6559-9913","authenticated-orcid":false,"given":"Yifan","family":"Qin","sequence":"first","affiliation":[{"name":"Department of Computer Science and Engineering, University of Notre Dame, Notre Dame, IN, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1830-606X","authenticated-orcid":false,"given":"Zheyu","family":"Yan","sequence":"additional","affiliation":[{"name":"Department of Computer Science and Engineering, University of Notre Dame, Notre Dame, IN, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0535-1259","authenticated-orcid":false,"given":"Dailin","family":"Gan","sequence":"additional","affiliation":[{"name":"Department of Applied and Computational Mathematics and Statistics, University of Notre Dame, Notre Dame, IN, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jun","family":"Xia","sequence":"additional","affiliation":[{"name":"Department of Computer Science and Engineering, University of Notre Dame, Notre Dame, IN, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Zixuan","family":"Pan","sequence":"additional","affiliation":[{"name":"Department of Computer Science and Engineering, University of Notre Dame, Notre Dame, IN, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0011-0675","authenticated-orcid":false,"given":"Wujie","family":"Wen","sequence":"additional","affiliation":[{"name":"Department of Computer Science, North Carolina State University, Raleigh, NC, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6636-9738","authenticated-orcid":false,"given":"Xiaobo","family":"Sharon Hu","sequence":"additional","affiliation":[{"name":"Department of Computer Science and Engineering, University of Notre Dame, Notre Dame, IN, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6788-9823","authenticated-orcid":false,"given":"Yiyu","family":"Shi","sequence":"additional","affiliation":[{"name":"Department of Computer Science and Engineering, University of Notre Dame, Notre Dame, IN, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.48550\/ARXIV.1706.03762"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.01042"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/85.238389"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/977091.977115"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/3007787.3001177"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6641\/abb842"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms8467"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/AICAS57966.2023.10168661"},{"key":"ref9","first-page":"859","article-title":"Uncertainty modeling of emerging device based computing-in-memory neural accelerators with application to neural architecture search","volume-title":"Proc. Asia\u2013South Pacific Design Autom. Conf.","author":"Yan"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1063\/1.3664631"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2009.5424411"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VTSA.2010.5488918"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1002\/aisy.202100199"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2015.04.025"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.23919\/DATE56975.2023.10137106"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.23919\/DATE48585.2020.9116244"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2020.2991575"},{"key":"ref18","first-page":"1","article-title":"TSB: Tiny shared block for efficient DNN deployment on NVCIM accelerators","volume-title":"Proc. IEEE\/ACM Int. Conf. Comput. Aided Design","author":"Qin"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1002\/aisy.202200029"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD57390.2023.10323830"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM19573.2019.8993491"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.2998457"},{"key":"ref23","first-page":"87","article-title":"Computing-in-memory neural network accelerators for safety-critical systems: Can small device variations be disastrous?","volume-title":"Proc. IEEE\/ACM Int. Conf. Comput.-Aided Design","author":"Yan"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/3502721"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/s10462-023-10562-9"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/3007787.3001139"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/3218603.3218640"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2019.2907886"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2021.3113300"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2018.00015"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2021.3068696"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/3489517.3530459"},{"key":"ref33","volume-title":"Deep Learning","volume":"1","author":"Goodfellow","year":"2016"},{"key":"ref34","first-page":"1019","article-title":"Sharp minima can generalize for deep nets","volume-title":"Proc. Int. Conf. Mach. Learn.","author":"Dinh"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2023.3257269"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/ICET55676.2022.9825190"},{"key":"ref37","first-page":"40277","article-title":"COLA: Orchestrating error coding and learning for robust neural network inference against hardware defects","volume-title":"Proc. Int. Conf. Mach. Learn.","author":"Yu"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1007\/s11432-023-3785-8"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1063\/5.0084660"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2023.3241750"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielam\/43\/11360509\/11087589-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/43\/11360509\/11087589.pdf?arnumber=11087589","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,1,22]],"date-time":"2026-01-22T21:02:16Z","timestamp":1769115736000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11087589\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,2]]},"references-count":40,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2025.3591409","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,2]]}}}