{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,23]],"date-time":"2026-04-23T21:01:37Z","timestamp":1776978097634,"version":"3.51.4"},"reference-count":35,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T00:00:00Z","timestamp":1777593600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T00:00:00Z","timestamp":1777593600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,5,1]],"date-time":"2026-05-01T00:00:00Z","timestamp":1777593600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["62574049"],"award-info":[{"award-number":["62574049"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"crossref","award":["62204045"],"award-info":[{"award-number":["62204045"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"crossref"}]},{"DOI":"10.13039\/501100001809","name":"State Key Laboratory of Integrated Chips and Systems, Fudan University","doi-asserted-by":"publisher","award":["SKLICSZ202402"],"award-info":[{"award-number":["SKLICSZ202402"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Joint Research Project of the Yangtze River Delta Science and Technology Innovation Community","award":["2024CSJGG00105"],"award-info":[{"award-number":["2024CSJGG00105"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst."],"published-print":{"date-parts":[[2026,5]]},"DOI":"10.1109\/tcad.2025.3610732","type":"journal-article","created":{"date-parts":[[2025,9,16]],"date-time":"2025-09-16T17:34:11Z","timestamp":1758044051000},"page":"2109-2122","source":"Crossref","is-referenced-by-count":1,"title":["Toward Exploring Fault-Tolerant Neural Architectures: A Hierarchical Codesign Optimization Framework"],"prefix":"10.1109","volume":"45","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1302-2087","authenticated-orcid":false,"given":"Chao","family":"Chen","sequence":"first","affiliation":[{"name":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0061-5502","authenticated-orcid":false,"given":"Liang","family":"Wang","sequence":"additional","affiliation":[{"name":"Beijing Microelectronics Technology Institute, Beijing, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8918-7320","authenticated-orcid":false,"given":"Yan","family":"Li","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3986-137X","authenticated-orcid":false,"given":"Xiaoyang","family":"Zeng","sequence":"additional","affiliation":[{"name":"State Key Laboratory of Integrated Chips and Systems, Fudan University, Shanghai, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/nature14539"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/3626314"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MDAT.2023.3241116"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2024.3365633"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2023.3302341"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3076185"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.23919\/DATE54114.2022.9774635"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.23919\/DATE54114.2022.9774523"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.23919\/DATE58400.2024.10546762"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DAC56929.2023.10247670"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DFT63277.2024.10753525"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2021.3129114"},{"key":"ref13","first-page":"1","article-title":"Understanding error propagation in deep learning neural network (DNN) accelerators and applications","volume-title":"Proc. Int. Conf. High Perform. Comput., Netw., Storage Anal.","author":"Li"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2018.8465834"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2023.3317138"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/3524500"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/3460288"},{"key":"ref18","first-page":"1","article-title":"Mutiple-gradient descent algorithm for multiobjective optimization","volume-title":"Proc. Eur. Congr. Comput. Methods Appl. Sci. Eng. (ECCOMAS)","author":"D\u00e9sid\u00e9ri"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.23919\/DATE51398.2021.9474024"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/DAC63849.2025.11132610"},{"key":"ref21","first-page":"1","article-title":"A fault-tolerant neural network architecture","volume-title":"Proc. 56th ACM\/IEEE Design Autom. Conf. (DAC)","author":"Liu"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2024.3507918"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1007\/s00521-020-04969-6"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2023.3306894"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.52202\/075280-0885"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2024.3409356"},{"key":"ref27","first-page":"853","article-title":"Winograd convolution: A perspective from fault tolerance","volume-title":"Proc. 59th ACM\/IEEE Design Autom. Conf.","author":"Xue"},{"key":"ref28","first-page":"1","article-title":"DARTS: Differentiable architecture search","volume-title":"Proc. Int. Conf. Learn. Represent.","author":"Liu"},{"key":"ref29","first-page":"1808","article-title":"Bridging the gap between sample-based and one-shot neural architecture search with BONAS","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","author":"Han"},{"key":"ref30","first-page":"2171","article-title":"Scalable Bayesian optimization using deep neural networks","volume-title":"Proc. Int. Conf. Mach. Learn.","author":"Snoek"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3070634"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.23919\/DATE48585.2020.9116571"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2020.3012209"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2023.3335144"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52733.2024.00570"}],"container-title":["IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/43\/11493579\/11165438.pdf?arnumber=11165438","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,4,23]],"date-time":"2026-04-23T19:59:21Z","timestamp":1776974361000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11165438\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,5]]},"references-count":35,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tcad.2025.3610732","relation":{},"ISSN":["0278-0070","1937-4151"],"issn-type":[{"value":"0278-0070","type":"print"},{"value":"1937-4151","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,5]]}}}