{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,23]],"date-time":"2026-10-23T20:18:07Z","timestamp":1792786687304,"version":"4.5.0"},"reference-count":47,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,6,1]],"date-time":"2026-06-01T00:00:00Z","timestamp":1780272000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"New Energy and Industrial Technology Development Organization","award":["JPNP23015"],"award-info":[{"award-number":["JPNP23015"]}],"id":[{"id":"https:\/\/ror.org\/0055k7a87","id-type":"ROR","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. Artif. Intel."],"published-print":{"date-parts":[[2026,6]]},"DOI":"10.1109\/tcasai.2026.3661436","type":"journal-article","created":{"date-parts":[[2026,2,6]],"date-time":"2026-02-06T20:47:35Z","timestamp":1770410855000},"page":"190-202","source":"Crossref","is-referenced-by-count":0,"title":["NanoCiM: Nano-ReRAM Computation-in-Memory with Neural Network Weight-Aware X-Address Scrambling to Suppress IR Drop-Oriented Bit-Line MAC Current Variation"],"prefix":"10.1109","volume":"3","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-4594-6839","authenticated-orcid":false,"given":"Chihiro","family":"Matsui","sequence":"first","affiliation":[{"name":"The University of Tokyo","place":["Tokyo, Japan"],"department":["Department of Electrical Engineering and Information Systems"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Ayumu","family":"Yamada","sequence":"additional","affiliation":[{"name":"The University of Tokyo","place":["Tokyo, Japan"],"department":["Department of Electrical Engineering and Information Systems"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-6223-7625","authenticated-orcid":false,"given":"Shota","family":"Suzuki","sequence":"additional","affiliation":[{"name":"The University of Tokyo","place":["Tokyo, Japan"],"department":["Department of Electrical Engineering and Information Systems"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-2067-5420","authenticated-orcid":false,"given":"Naoko","family":"Misawa","sequence":"additional","affiliation":[{"name":"The University of Tokyo","place":["Tokyo, Japan"],"department":["Department of Electrical Engineering and Information Systems"]}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9345-6503","authenticated-orcid":false,"given":"Ken","family":"Takeuchi","sequence":"additional","affiliation":[{"name":"The University of Tokyo","place":["Tokyo, Japan"],"department":["Department of Electrical Engineering and Information Systems"]}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42613.2021.9365803"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/mcas.2021.3092533"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/mssc.2019.2922889"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/vlsit.2018.8510676"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/nanoarch.2017.8053725"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/iedm.2014.7047135"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/iedm.2017.8268341"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/vlsit.2018.8510688"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/mssc.2016.2546199"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/mc.2024.3363269"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/icicdt.2014.6838600"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/irps48204.2025.10983826"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1038\/s41467-020-16108-9"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/snw56633.2022.9889067"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/iedm.2015.7409718"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/irps46558.2021.9405200"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/jproc.2018.2790840"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2019.8662395"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/access.2020.3044652"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/3371277"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2898010"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1587\/transfun.2025vlp0011"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/3569940"},{"key":"ref24","article-title":"SWANN: Shuffling weights in crossbar arrays for enhanced DNN accuracy in deeply scaled technologies","author":"Victor","year":"2024"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/tetci.2018.2829919"},{"key":"ref26","first-page":"854","article-title":"Technology-design co-optimization of resistive cross-point array for accelerating learning algorithms on chip","volume-title":"Proc. Des., Automat. Test Europe Conf. Exhib. (DATE)","author":"Chen","year":"2015"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2022.3225512"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/led.2017.2709248"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/iitc-mam.2015.7325605"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.3390\/mi10050306"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/irps48227.2022.9764486"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/iccad.2015.7372570"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.23919\/date54114.2022.9774736"},{"key":"ref34","article-title":"X-CHANGR: Changing memristive crossbar mapping for mitigating line-resistance induced accuracy degradation in deep neural networks","author":"Agrawal","year":"2019"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2015.2391254"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2017.2782087"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/isscc19947.2020.9062985"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2023.3336379"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/16.992867"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/16.992868"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/16.249433"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.1983.1051966"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/irps.2017.7936321"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/cvprw.2017.61"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/imw51353.2021.9439610"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2009.4977396"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/iccad57390.2023.10323664"}],"container-title":["IEEE Transactions on Circuits and Systems for Artificial Intelligence"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10495160\/11540105\/11372941.pdf?arnumber=11372941","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,9,30]],"date-time":"2026-09-30T19:21:39Z","timestamp":1790796099000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11372941\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,6]]},"references-count":47,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tcasai.2026.3661436","relation":{},"ISSN":["2996-6647"],"issn-type":[{"value":"2996-6647","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,6]]}}}