{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,13]],"date-time":"2026-10-13T22:55:37Z","timestamp":1791932137338,"version":"4.3.4"},"reference-count":37,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2023,7,1]],"date-time":"2023-07-01T00:00:00Z","timestamp":1688169600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,7,1]],"date-time":"2023-07-01T00:00:00Z","timestamp":1688169600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,7,1]],"date-time":"2023-07-01T00:00:00Z","timestamp":1688169600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61973023"],"award-info":[{"award-number":["61973023"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Cloud Comput."],"published-print":{"date-parts":[[2023,7,1]]},"DOI":"10.1109\/tcc.2023.3285654","type":"journal-article","created":{"date-parts":[[2023,6,13]],"date-time":"2023-06-13T17:20:12Z","timestamp":1686676812000},"page":"3301-3313","source":"Crossref","is-referenced-by-count":15,"title":["Branchy Deep Learning Based Real-Time Defect Detection Under Edge-Cloud Fusion Architecture"],"prefix":"10.1109","volume":"11","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6847-8452","authenticated-orcid":false,"given":"Jing","family":"Wang","sequence":"first","affiliation":[{"name":"College of Information Science and Technology, Beijing University of Chemical Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-9327-9180","authenticated-orcid":false,"given":"Yi","family":"Wu","sequence":"additional","affiliation":[{"name":"College of Information Science and Technology, Beijing University of Chemical Technology, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7422-5988","authenticated-orcid":false,"given":"Yang-Quan","family":"Chen","sequence":"additional","affiliation":[{"name":"Mechatronics, Embedded Systems and Automation Lab, University of California, Merced, CA, USA"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2017.2670505"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1049\/trit.2019.0019"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/45.464686"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1016\/j.aei.2020.101037"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2014.2388435"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2015.2417676"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2016.04.072"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.jmsy.2018.01.003"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/ma13245755"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1115\/1.4049535"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2014.81"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.3390\/electronics8050481"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/AIAM48774.2019.00136"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.future.2018.04.057"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MIE.2019.2943283"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2016.2579198"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/CC.2017.8233651"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/COMST.2020.2970550"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2017.2780236"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/MCOM.2017.1700360"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2019.2947539"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2020.2983050"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/LCA.2022.3215718"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ICPR.2016.7900006"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1002\/spe.2839"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/COMST.2021.3106401"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/SOCA.2016.10"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2018.2889511"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.comnet.2019.01.036"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/JIOT.2019.2958097"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2018.2842821"},{"key":"ref32","first-page":"91","article-title":"Faster R-CNN: Towards real-time object detection with region proposal networks","volume-title":"Proc. Int. Conf. Neural Inf. Process. Syst.","author":"Ren"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/1827\/1\/012085"},{"key":"ref34","article-title":"Pruning convolutional neural networks for resource efficient inference","author":"Molchanov","year":"2016"},{"key":"ref35","article-title":"Online PCB defect detector on a new PCB defect dataset","author":"Tang","year":"2019"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-46448-0_2"}],"container-title":["IEEE Transactions on Cloud Computing"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6245519\/10241247\/10149362.pdf?arnumber=10149362","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,6]],"date-time":"2024-06-06T17:09:51Z","timestamp":1717693791000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10149362\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,7,1]]},"references-count":37,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tcc.2023.3285654","relation":{},"ISSN":["2168-7161","2372-0018"],"issn-type":[{"value":"2168-7161","type":"electronic"},{"value":"2372-0018","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,7,1]]}}}