{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,9,29]],"date-time":"2025-09-29T12:05:19Z","timestamp":1759147519996},"reference-count":37,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2012,8,1]],"date-time":"2012-08-01T00:00:00Z","timestamp":1343779200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Consumer Electron."],"published-print":{"date-parts":[[2012,8]]},"DOI":"10.1109\/tce.2012.6311327","type":"journal-article","created":{"date-parts":[[2012,9,29]],"date-time":"2012-09-29T16:32:48Z","timestamp":1348936368000},"page":"849-856","source":"Crossref","is-referenced-by-count":8,"title":["PCRAM-assisted ECC management for enhanced data reliability in flash storage systems"],"prefix":"10.1109","volume":"58","author":[{"given":"Hakyong","family":"Lee","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sanghyuk","family":"Jung","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yong","family":"Song","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref33","author":"niemela","year":"2005","journal-title":"PCMark05 PC Performance Analysis White Paper"},{"key":"ref32","article-title":"KVM: the Linux virtual machine monitor","author":"kivity","year":"2007","journal-title":"Ottawa Linux Symposium"},{"key":"ref31","article-title":"QEMU, a fast and portable dynamic translator","author":"bellard","year":"2005","journal-title":"Proc of USENIX Annual Technical Conference"},{"key":"ref30","first-page":"288","article-title":"Computer Architecture: A Quantitative Approach","author":"hennessy","year":"2006"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.jss.2009.03.008"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1145\/1837915.1837921"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1145\/1416944.1416949"},{"key":"ref34","article-title":"Hammerora: the open source oracle load test tool","author":"shaw","year":"2011"},{"key":"ref10","article-title":"Exploiting Memory Device Wear-Out Dynamics to Improve NAND Flash Memory System Performance","author":"pan","year":"2011","journal-title":"Proc of the USENIX Conference on File and Storage Technologies"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/SC.2010.16"},{"key":"ref12","first-page":"145","article-title":"Error Correction Codes for Non-Volatile Memories","author":"micheloni","year":"2008"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2010.2070050"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2011.5873227"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/1450058.1450064"},{"key":"ref16","year":"2009","journal-title":"International Technology Roadmap for Semiconductors (ITRS)"},{"key":"ref17","article-title":"K9XXG08U0M 2G x 8bit NAND Flash Memory Data Sheet","year":"2006","journal-title":"Samsung Electronics"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2010.5433916"},{"key":"ref19","first-page":"474","article-title":"A 90nm 1.8V 512Mb Diode-Switch PRAM with 266MB\/s Read Throughput","author":"lee","year":"2007","journal-title":"IEEE ISSCC Dig Tech Papers"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2011.6131151"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-90-481-9431-5"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2006.1649669"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/2168836.2168862"},{"key":"ref6","doi-asserted-by":"crossref","first-page":"338","DOI":"10.1016\/j.sysarc.2009.03.005","article-title":"A survey of flash translation layer","volume":"55","author":"chung","year":"2009","journal-title":"J Syst Architecture"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.sysarc.2007.01.010"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1879021.1879045"},{"key":"ref8","article-title":"FAST: An FTL Scheme with Fully Associative Sector Translations","author":"lee","year":"2005","journal-title":"UKC 2005"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2002.1010143"},{"key":"ref2","year":"1998","journal-title":"Understanding the Flash Translation Layer (FTL) Specification"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.917558"},{"key":"ref1","article-title":"Design Tradeoffs for SSD Performance","author":"agrawal","year":"2008","journal-title":"Proc of the USENIX Annual Technical Conference"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/2039252.2039258"},{"key":"ref22","first-page":"1","article-title":"Technology Challenges for Deep-nano Semiconductor Memory","author":"kim","year":"2010","journal-title":"IMW Proceedings"},{"key":"ref21","article-title":"Signal Processing and the Evolution of NAND Flash Memory","volume":"8","author":"sommer","year":"2010","journal-title":"Embedded Computing Design"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2003.811709"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.2008.4558857"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2010.5681118"},{"key":"ref25","article-title":"Error Patterns in MLC NAND Flash Memory: Measurement, Characterization, and Analysis","author":"cai","year":"2012","journal-title":"Proceedings of Design Automation and Test in Europe Conference and Exhibition"}],"container-title":["IEEE Transactions on Consumer Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/30\/6311306\/06311327.pdf?arnumber=6311327","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:01:56Z","timestamp":1642003316000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6311327\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,8]]},"references-count":37,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tce.2012.6311327","relation":{},"ISSN":["0098-3063"],"issn-type":[{"value":"0098-3063","type":"print"}],"subject":[],"published":{"date-parts":[[2012,8]]}}}