{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,7]],"date-time":"2026-04-07T23:07:01Z","timestamp":1775603221863,"version":"3.50.1"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2016,8,1]],"date-time":"2016-08-01T00:00:00Z","timestamp":1470009600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Consumer Electron."],"published-print":{"date-parts":[[2016,8]]},"DOI":"10.1109\/tce.2016.7613193","type":"journal-article","created":{"date-parts":[[2016,10,26]],"date-time":"2016-10-26T18:15:18Z","timestamp":1477505718000},"page":"267-274","source":"Crossref","is-referenced-by-count":7,"title":["Design guidelines of storage class memory\/flash hybrid solid-state drive considering system architecture, algorithm and workload characteristic"],"prefix":"10.1109","volume":"62","author":[{"given":"Chao","family":"Sun","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shun","family":"Okamoto","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shogo","family":"Hachiya","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tomoaki","family":"Yamada","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Ken","family":"Takeuchi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","first-page":"1447","article-title":"A block-level Flash memory management scheme for reducing write activities in PCM based embedded systems","author":"liu","year":"2012","journal-title":"Proc Eur Conf Exhib Design Autom Test"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2010.5681118"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2012.6311326"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2012.6311327"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2012.6170059"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2010.5439133"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/1450058.1450064"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2012.6311324"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2091324"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1145\/1416944.1416949"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2015.7150277"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2012.6243826"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2012.6176872"},{"key":"ref5","first-page":"210","article-title":"A 130.7 2-layer 32 Gb ReRAM memory device in 24 nm technology","author":"liu","year":"2013","journal-title":"Proc IEEE International Solid-State Circuits Conference"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2012.6479019"},{"key":"ref7","first-page":"110","article-title":"A 1.5 nsec\/2.1 nsec random read\/write cycle 1 Mb STTRAM using 6T2MTJ cell with background write for nonvolatile e-Memories","author":"ohsawa","year":"0"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2013.2268111"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IMW.2013.6582099"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1630086"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2014.2309780"}],"container-title":["IEEE Transactions on Consumer Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/30\/7613181\/07613193.pdf?arnumber=7613193","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:02:10Z","timestamp":1642003330000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7613193\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,8]]},"references-count":20,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tce.2016.7613193","relation":{},"ISSN":["0098-3063"],"issn-type":[{"value":"0098-3063","type":"print"}],"subject":[],"published":{"date-parts":[[2016,8]]}}}