{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,14]],"date-time":"2026-04-14T15:47:24Z","timestamp":1776181644494,"version":"3.50.1"},"reference-count":58,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2024,8,1]],"date-time":"2024-08-01T00:00:00Z","timestamp":1722470400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,8,1]],"date-time":"2024-08-01T00:00:00Z","timestamp":1722470400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,8,1]],"date-time":"2024-08-01T00:00:00Z","timestamp":1722470400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Consumer Electron."],"published-print":{"date-parts":[[2024,8]]},"DOI":"10.1109\/tce.2024.3433432","type":"journal-article","created":{"date-parts":[[2024,7,25]],"date-time":"2024-07-25T17:24:34Z","timestamp":1721928274000},"page":"5300-5311","source":"Crossref","is-referenced-by-count":8,"title":["Remote Sensing Image Dehazing Based on Dual Attention Parallelism and Frequency Domain Selection Network"],"prefix":"10.1109","volume":"70","author":[{"given":"Hang","family":"Su","sequence":"first","affiliation":[{"name":"School of Electrical and Electronic Engineering, Shandong University of Technology, Zibo, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6359-6372","authenticated-orcid":false,"given":"Lina","family":"Liu","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Shandong University of Technology, Zibo, China"}]},{"given":"Gwanggil","family":"Jeon","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Shandong University of Technology, Zibo, China"}]},{"given":"Zenghui","family":"Wang","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Shandong University of Technology, Zibo, China"}]},{"given":"Tiancun","family":"Guo","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Shandong University of Technology, Zibo, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7273-7499","authenticated-orcid":false,"given":"Mingliang","family":"Gao","sequence":"additional","affiliation":[{"name":"School of Electrical and Electronic Engineering, Shandong University of Technology, Zibo, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2018.2884794"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52729.2023.00721"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2022.3140856"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2022.3233881"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1080\/01431161.2022.2073795"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1016\/j.isprsjprs.2020.01.013"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.00717"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/83.660994"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2010.168"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2016.2598681"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-46475-6_10"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2017.511"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3024335"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.2981719"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s11760-021-01960-z"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW53098.2021.00029"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3099224"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/2089\/1\/012064"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICME.2018.8486435"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.00223"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR46437.2021.01041"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2023.3256763"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v34i07.6865"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV.2019.00741"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR42600.2020.01155"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3390\/rs13132432"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.cviu.2017.08.002"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1016\/j.neucom.2019.10.005"},{"key":"ref29","article-title":"Deep residual fourier transformation for single image deblurring","author":"Mao","year":"2021","journal-title":"arXiv:2111.11745"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP.2019.8803391"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00337"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.00572"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.00986"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.3390\/rs11243008"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2020.3004556"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2020.3006533"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP42928.2021.9506603"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.3390\/rs13163104"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/WACV48630.2021.00046"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1007\/s11045-022-00835-x"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00745"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.48550\/ARXIV.1807.06521"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1016\/j.patcog.2020.107255"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.00460"},{"key":"ref45","first-page":"1","article-title":"Selective frequency network for image restoration","volume-title":"Proc. 11th Int. Conf. Learn. Represent.","author":"Cui"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/WACV48630.2021.00360"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/ACSSC.2003.1292216"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3170594"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1016\/j.ins.2019.02.058"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00343"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/CVPRW53098.2021.00028"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1109\/LGRS.2022.3232544"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52688.2022.01716"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1109\/ICME55011.2023.00276"},{"key":"ref55","doi-asserted-by":"publisher","DOI":"10.1016\/j.sigpro.2023.109225"},{"key":"ref56","doi-asserted-by":"publisher","DOI":"10.1109\/WACV45572.2020.9093471"},{"key":"ref57","article-title":"A remote sensing image dataset for cloud removal","author":"Lin","year":"2019","journal-title":"arXiv:1901.00600"},{"key":"ref58","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2019.2955241"}],"container-title":["IEEE Transactions on Consumer Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/30\/10798997\/10609425.pdf?arnumber=10609425","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,14]],"date-time":"2024-12-14T06:29:38Z","timestamp":1734157778000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10609425\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,8]]},"references-count":58,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tce.2024.3433432","relation":{},"ISSN":["0098-3063","1558-4127"],"issn-type":[{"value":"0098-3063","type":"print"},{"value":"1558-4127","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,8]]}}}