{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,3]],"date-time":"2026-07-03T16:50:15Z","timestamp":1783097415198,"version":"3.54.6"},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2025,2,1]],"date-time":"2025-02-01T00:00:00Z","timestamp":1738368000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,2,1]],"date-time":"2025-02-01T00:00:00Z","timestamp":1738368000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,2,1]],"date-time":"2025-02-01T00:00:00Z","timestamp":1738368000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62472062"],"award-info":[{"award-number":["62472062"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100017683","name":"Dalian Science and Technology Innovation Fund Project","doi-asserted-by":"publisher","award":["2024JJ12GX022"],"award-info":[{"award-number":["2024JJ12GX022"]}],"id":[{"id":"10.13039\/501100017683","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Dalian Excellent Young Project","award":["2022RY35"],"award-info":[{"award-number":["2022RY35"]}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["3132024257"],"award-info":[{"award-number":["3132024257"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Consumer Electron."],"published-print":{"date-parts":[[2025,2]]},"DOI":"10.1109\/tce.2024.3524511","type":"journal-article","created":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T14:27:48Z","timestamp":1735741668000},"page":"905-917","source":"Crossref","is-referenced-by-count":3,"title":["Uncertainty Estimation of Automatic Software Debugging in Open-Source Projects Hosting Platform"],"prefix":"10.1109","volume":"71","author":[{"given":"Hetong","family":"Liang","sequence":"first","affiliation":[{"name":"School of Information Science and Technology, and the Dalian Key Laboratory of Artificial Intelligence, Dalian Maritime University, Dalian, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8554-6365","authenticated-orcid":false,"given":"Shikai","family":"Guo","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, and the Dalian Key Laboratory of Artificial Intelligence, Dalian Maritime University, Dalian, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1923-0669","authenticated-orcid":false,"given":"Hui","family":"Li","sequence":"additional","affiliation":[{"name":"School of Information Science and Technology, Dalian Maritime University, Dalian, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0005-2402-9726","authenticated-orcid":false,"given":"Chenchen","family":"Li","sequence":"additional","affiliation":[{"name":"School of Computer and Artificial Intelligence, Liaoning Normal University, Dalian, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-021-10007-3"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2024.3407968"},{"key":"ref3","article-title":"The economic impacts of inadequate infrastructure for software testing","author":"Planning","year":"2002"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2024.3387708"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/1064978.1065014"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICST.2014.28"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/2000791.2000795"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1142\/S0218194022500012"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/3293882.3330574"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE43902.2021.00067"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/3510003.3510147"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/SANER.2017.7884635"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/SANER.2019.8667970"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/3293882.3330577"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/3360588"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/3276517"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/2610384.2628055"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1145\/3092703.3092717"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2024.3384674"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/3576043"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s10515-023-00383-z"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/3510003.3510073"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1145\/3597503.3623342"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1145\/3213846.3213871"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/s10664-019-09780-z"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1145\/3510003.3510222"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/3468264.3468544"},{"key":"ref28","first-page":"602","article-title":"DLFix: Context-based code transformation learning for automated program repair","volume-title":"Proc. ACM\/IEEE 42nd Int. Conf. Softw. Eng.","author":"Li"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/3395363.3397369"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ICSE43902.2021.00107"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1613\/jair.1.12125"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/3133916"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/PRDC.2006.18"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1145\/1101908.1101949"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/SERE.2012.12"},{"key":"ref36","article-title":"Learning to generate corrective patches using neural machine translation","author":"Hata","year":"2019","journal-title":"arXiv:1812.07170"}],"container-title":["IEEE Transactions on Consumer Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/30\/11038962\/10819502.pdf?arnumber=10819502","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,10]],"date-time":"2025-10-10T17:36:45Z","timestamp":1760117805000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10819502\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,2]]},"references-count":36,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tce.2024.3524511","relation":{},"ISSN":["0098-3063","1558-4127"],"issn-type":[{"value":"0098-3063","type":"print"},{"value":"1558-4127","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,2]]}}}