{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,8]],"date-time":"2026-04-08T20:12:28Z","timestamp":1775679148672,"version":"3.50.1"},"reference-count":49,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2025,5,1]],"date-time":"2025-05-01T00:00:00Z","timestamp":1746057600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,5,1]],"date-time":"2025-05-01T00:00:00Z","timestamp":1746057600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,5,1]],"date-time":"2025-05-01T00:00:00Z","timestamp":1746057600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Consumer Electron."],"published-print":{"date-parts":[[2025,5]]},"DOI":"10.1109\/tce.2025.3562388","type":"journal-article","created":{"date-parts":[[2025,4,18]],"date-time":"2025-04-18T13:37:13Z","timestamp":1744983433000},"page":"3218-3228","source":"Crossref","is-referenced-by-count":1,"title":["Optimized EEG Multi-Noise Removal and Compression: Deploying a PbP-QLP Enhanced Autoencoder on STM32 Microcontroller"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0009-0008-2840-0133","authenticated-orcid":false,"given":"Deepak","family":"Kumar","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Indian Institute of Technology Patna, Patna, India"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3851-765X","authenticated-orcid":false,"given":"Udit","family":"Satija","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Indian Institute of Technology Patna, Patna, India"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2553278"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/tce.2024.3425478"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3142037"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2019.2891636"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2010.5681149"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2019.2903648"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3206620"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TNSRE.2022.3201197"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3173261"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2962658"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2013.6689694"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/embc40787.2023.10340077"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2010.2043985"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1088\/1741-2552\/aa8d95"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TNSRE.2021.3054733"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2019.2942153"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1049\/htl.2019.0053"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1155\/2014\/261347"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JBHI.2014.2328317"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2011.2115236"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2014.2385868"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2912036"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JBHI.2024.3358917"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TNSRE.2023.3330963"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2022.3161994"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3341114"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2021.3091800"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/jbhi.2023.3277596"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2008.4560139"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.3014922"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1145\/3126555"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2021.3066258"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1016\/j.dib.2016.06.032"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1103\/physreve.64.061907"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TNSRE.2018.2864306"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/tce.2024.3478310"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1023\/B:MACH.0000033113.59016.96"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/ICASSP.2019.8682755"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3210773"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1007\/s00034-022-02057-9"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3043506"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TITB.2012.2194298"},{"issue":"1","key":"ref43","first-page":"381","article-title":"A noise stress test for arrhythmia detectors","volume":"11","author":"Moody","year":"2013","journal-title":"Comput. Cardiol."},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/JBHI.2022.3227320"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/30.85578"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2012.2225427"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3147010"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/TNSRE.2018.2794184"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/TNSRE.2022.3147072"}],"container-title":["IEEE Transactions on Consumer Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/30\/11128999\/10970023.pdf?arnumber=10970023","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,10]],"date-time":"2025-10-10T17:36:40Z","timestamp":1760117800000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10970023\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,5]]},"references-count":49,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tce.2025.3562388","relation":{},"ISSN":["0098-3063","1558-4127"],"issn-type":[{"value":"0098-3063","type":"print"},{"value":"1558-4127","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,5]]}}}