{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,26]],"date-time":"2026-03-26T20:54:22Z","timestamp":1774558462988,"version":"3.50.1"},"reference-count":37,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,2,1]],"date-time":"2026-02-01T00:00:00Z","timestamp":1769904000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Consumer Electron."],"published-print":{"date-parts":[[2026,2]]},"DOI":"10.1109\/tce.2025.3644921","type":"journal-article","created":{"date-parts":[[2025,12,17]],"date-time":"2025-12-17T18:45:56Z","timestamp":1765997156000},"page":"1685-1698","source":"Crossref","is-referenced-by-count":0,"title":["Noise-Resilient Deep Learning Architecture for Bearing Fault Diagnosis in Integrated IoT Sensing\u2013Computing Environments"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-0494-6269","authenticated-orcid":false,"given":"Neeraj","family":"Jain","sequence":"first","affiliation":[{"name":"School of Computer Science Engineering and Technology, Bennett University, Greater Noida, India"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5438-579X","authenticated-orcid":false,"given":"Vishal Krishna","family":"Singh","sequence":"additional","affiliation":[{"name":"School of Computer Science and Electronics Engineering, University of Essex, Colchester, U.K."}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5310-1345","authenticated-orcid":false,"given":"Chhaya","family":"Singh","sequence":"additional","affiliation":[{"name":"School of Computer Science and Engineering, Galgotias University, Greater Noida, India"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8993-1519","authenticated-orcid":false,"given":"Gaurav","family":"Tripathi","sequence":"additional","affiliation":[{"name":"School of Computer Science Engineering and Technology, Bennett University, Greater Noida, India"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4571-1888","authenticated-orcid":false,"given":"Rajkumar Singh","family":"Rathore","sequence":"additional","affiliation":[{"name":"Department of Computer Science, School of Technologies, Cardiff Metropolitan University, Cardiff, U.K."}]},{"given":"Divyanshu","family":"Chaudhari","sequence":"additional","affiliation":[{"name":"NICE, Pune, India"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2774261"},{"key":"ref2","volume-title":"Signal Processing for Fault Detection and Diagnosis in Electric Machines and Systems","author":"Benbouzid","year":"2021"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1155\/2020\/8849513"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2020.3003793"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2018.2839083"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3042315"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3067187"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TEC.2020.3046642"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/en13112953"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2013.2267931"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2022.3167632"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2022.3178483"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2023.3244237"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3213657"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.3043946"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2021.3083891"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2019.05.079"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.promfg.2018.03.089"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2019.07.007"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1006\/mssp.2001.1462"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/s00170-019-03557-w"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.5545\/sv-jme.2018.5249"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2021.3056944"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2017.06.022"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2023.3251654"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3390\/s19040972"},{"key":"ref27","volume-title":"Bearing data center seeded fault test data","author":"Bayba","year":"2005"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.3390\/s17020425"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2020.2985617"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2017.2767540"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1016\/j.ymssp.2006.12.007"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1145\/2939672.2939785"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2024.3361037"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2024.3476156"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2025.3541251"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2025.3571035"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2025.3586957"}],"container-title":["IEEE Transactions on Consumer Electronics"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/30\/11456295\/11301764.pdf?arnumber=11301764","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,26]],"date-time":"2026-03-26T19:51:20Z","timestamp":1774554680000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11301764\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,2]]},"references-count":37,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tce.2025.3644921","relation":{},"ISSN":["0098-3063","1558-4127"],"issn-type":[{"value":"0098-3063","type":"print"},{"value":"1558-4127","type":"electronic"}],"subject":[],"published":{"date-parts":[[2026,2]]}}}