{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,10]],"date-time":"2026-01-10T23:49:56Z","timestamp":1768088996016,"version":"3.49.0"},"reference-count":55,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,1,1]],"date-time":"2021-01-01T00:00:00Z","timestamp":1609459200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004835","name":"Zhejiang University","doi-asserted-by":"publisher","award":["188020*194222002\/019\/007"],"award-info":[{"award-number":["188020*194222002\/019\/007"]}],"id":[{"id":"10.13039\/501100004835","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput. Imaging"],"published-print":{"date-parts":[[2021]]},"DOI":"10.1109\/tci.2021.3099632","type":"journal-article","created":{"date-parts":[[2021,7,26]],"date-time":"2021-07-26T21:43:58Z","timestamp":1627335838000},"page":"789-798","source":"Crossref","is-referenced-by-count":19,"title":["A Reliable Deep Learning Scheme for Nonlinear Reconstructions in Electrical Impedance Tomography"],"prefix":"10.1109","volume":"7","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-8699-3749","authenticated-orcid":false,"given":"Zhun","family":"Wei","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3516-0261","authenticated-orcid":false,"given":"Zheng","family":"Zong","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9772-6400","authenticated-orcid":false,"given":"Yusong","family":"Wang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1177\/0142331219845037"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2019.2954722"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2018.2833635"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2020.3012177"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2018.2869221"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2017.2739299"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.3390\/s19071521"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2019.2891676"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2018.2828303"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1016\/j.neunet.2020.07.025"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2020.2972172"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1088\/0957-0233\/19\/1\/015501"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2020.2965202"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2019.2948909"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/380509a0"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1137\/060676350"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2004.827482"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2017.2695893"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.3934\/ipi.2014.8.1013"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2016.2613511"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1137\/140978272"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/20\/3\/016"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1088\/0143-0815\/9\/4A\/007"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.2528\/PIER20120401"},{"key":"ref55","article-title":"Open 2D electrical impedance tomography data archive","author":"hauptmann","year":"2017"},{"key":"ref54","doi-asserted-by":"publisher","DOI":"10.1364\/AO.28.002358"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1109\/LPT.2019.2952177"},{"key":"ref52","doi-asserted-by":"crossref","first-page":"600","DOI":"10.1109\/TIP.2003.819861","article-title":"Image quality assessment: From error visibility to structural similarity","volume":"13","author":"zhou","year":"2004","journal-title":"IEEE Trans Image Process"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1088\/0967-3334\/36\/6\/1193"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2015.2509508"},{"key":"ref40","doi-asserted-by":"crossref","first-page":"422(1)","DOI":"10.3390\/electronics7120422","article-title":"Towards a fast and accurate EIT inverse problem solver: A machine learning approach","volume":"7","author":"fern\u00e1ndez-fuentes","year":"2018","journal-title":"Electronics"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.apm.2015.06.026"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/19\/5\/309"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TGRS.2009.2025122"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1002\/9781119311997"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1163\/156939309789476301"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2010.2053553"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1088\/0266-5611\/30\/4\/045005"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1590\/S0101-82052006000200002"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JERM.2019.2893217"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2019.2961938"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6420\/aaaf84"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/S1350-4533(02)00194-7"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2020.2983055"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.neuroimage.2015.08.071"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2020.3030974"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TBME.2018.2890410"},{"key":"ref46","first-page":"234","article-title":"U-Net: Convolutional networks for biomedical image segmentation","author":"ronneberger","year":"2015","journal-title":"Proc 18th Int Conf Med Image Comput Comput -Assist Interv"},{"key":"ref45","first-page":"1050","article-title":"Dropout as a Bayesian approximation: Representing model uncertainty in deep learning","author":"gal","year":"2016","journal-title":"Proc 33rd Int Conf Mach Learn"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1364\/OPTICA.6.000618"},{"key":"ref47","first-page":"5574","author":"kendall","year":"2017","journal-title":"Proc Adv Neural Inf Process Syst"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.2528\/PIER20030705"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1038\/s41551-018-0324-9"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.2528\/PIER16082302"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2017.2713099"}],"container-title":["IEEE Transactions on Computational Imaging"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6745852\/9318600\/09496105.pdf?arnumber=9496105","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T14:54:10Z","timestamp":1652194450000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9496105\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021]]},"references-count":55,"URL":"https:\/\/doi.org\/10.1109\/tci.2021.3099632","relation":{},"ISSN":["2333-9403","2334-0118","2573-0436"],"issn-type":[{"value":"2333-9403","type":"electronic"},{"value":"2334-0118","type":"electronic"},{"value":"2573-0436","type":"print"}],"subject":[],"published":{"date-parts":[[2021]]}}}