{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,14]],"date-time":"2026-04-14T15:52:32Z","timestamp":1776181952022,"version":"3.50.1"},"reference-count":51,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Draper Fellowship"},{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["1815896"],"award-info":[{"award-number":["1815896"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["2039762"],"award-info":[{"award-number":["2039762"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput. Imaging"],"published-print":{"date-parts":[[2023]]},"DOI":"10.1109\/tci.2023.3282042","type":"journal-article","created":{"date-parts":[[2023,6,13]],"date-time":"2023-06-13T17:21:50Z","timestamp":1686676910000},"page":"581-593","source":"Crossref","is-referenced-by-count":3,"title":["Denoising Particle Beam Micrographs With Plug-and-Play Methods"],"prefix":"10.1109","volume":"9","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1041-8278","authenticated-orcid":false,"given":"Minxu","family":"Peng","sequence":"first","affiliation":[{"name":"Department of Electrical and Computer Engineering, Boston University, Boston, MA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-8084-0071","authenticated-orcid":false,"given":"Ruangrawee","family":"Kitichotkul","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Boston University, Boston, MA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1239-3003","authenticated-orcid":false,"given":"Sheila W.","family":"Seidel","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Boston University, Boston, MA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Christopher","family":"Yu","sequence":"additional","affiliation":[{"name":"Charles Stark Draper Laboratory, Cambridge, MA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8471-7049","authenticated-orcid":false,"given":"Vivek K","family":"Goyal","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Boston University, Boston, MA, USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2020.112948"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1038\/s41586-018-0298-5"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2022.113662"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCI.2021.3076887"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1116\/1.3253549"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1116\/1.3237101"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2019.2949470"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSAIT.2023.3283911"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TMI.2018.2865202"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2017.300"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2003.819861"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1109\/TPAMI.2010.161"},{"key":"ref46","first-page":"5546","article-title":"Plug-and-play methods provably converge with properly trained denoisers","author":"ryu","year":"0","journal-title":"Proc Int Conf Mach Learn"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/IEEECONF51394.2020.9443410"},{"key":"ref48","article-title":"NFFA-EUROPE - SEMdataset","author":"aversa","year":"2018"},{"key":"ref47","article-title":"Goyal-STIR-Group\/PnP-Particle-Beam-Micrograph-Denoising: PnP PBM Denoising 1.0.0 Release","author":"kitichotkul","year":"2023"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2017.2710233"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TCI.2019.2899499"},{"key":"ref44","first-page":"448","article-title":"Batch normalization: Accelerating deep network training by reducing internal covariate shift","author":"ioffe","year":"0","journal-title":"Proc Int Conf Mach Learn"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2016.90"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1063\/1.2799423"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1146\/annurev-anchem-061318-115457"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1021\/jp209864e"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1116\/1.588663"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1017\/S1551929500050240"},{"key":"ref3","author":"notte","year":"2016","journal-title":"Helium Ion Microscopy"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1038\/srep03514"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1063\/1.4947277"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1137\/1.9781611977134"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1007\/BF02124750"},{"key":"ref34","article-title":"Imaging with helium ions–A new detector regime with new challenges and new opportunities","author":"notte","year":"0","journal-title":"Proc Amer Vac Soc 60th Int Symp Exhibit"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2009.2028250"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1561\/2200000016"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1017\/S1431927622001064"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.ultramic.2012.11.005"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1017\/S1431927621002026"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ICIP42928.2021.9506340"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1116\/1.2357967"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/sca.4950170309"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.2307\/2527477"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/LSP.2017.2763583"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.jvcir.2016.09.009"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2010.2053941"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/MLSP52302.2021.9596272"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/0167-2789(92)90242-F"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCI.2016.2629286"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/GlobalSIP.2013.6737048"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2022.3199595"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2007.901238"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCI.2022.3182212"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2017.2662206"}],"container-title":["IEEE Transactions on Computational Imaging"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielam\/6745852\/10038323\/10149377-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6745852\/10038323\/10149377.pdf?arnumber=10149377","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,7,3]],"date-time":"2023-07-03T18:25:33Z","timestamp":1688408733000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10149377\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023]]},"references-count":51,"URL":"https:\/\/doi.org\/10.1109\/tci.2023.3282042","relation":{},"ISSN":["2333-9403","2334-0118","2573-0436"],"issn-type":[{"value":"2333-9403","type":"electronic"},{"value":"2334-0118","type":"electronic"},{"value":"2573-0436","type":"print"}],"subject":[],"published":{"date-parts":[[2023]]}}}