{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,15]],"date-time":"2026-07-15T21:08:51Z","timestamp":1784149731163,"version":"3.55.0"},"reference-count":44,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","license":[{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,1,1]],"date-time":"2026-01-01T00:00:00Z","timestamp":1767225600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Program of China","award":["2022YFF0706400"],"award-info":[{"award-number":["2022YFF0706400"]}]},{"name":"Graduate research and innovation foundation of Chongqing, China","award":["CYB25016"],"award-info":[{"award-number":["CYB25016"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Comput. Imaging"],"published-print":{"date-parts":[[2026]]},"DOI":"10.1109\/tci.2026.3701585","type":"journal-article","created":{"date-parts":[[2026,7,14]],"date-time":"2026-07-14T19:41:24Z","timestamp":1784058084000},"page":"1241-1253","source":"Crossref","is-referenced-by-count":0,"title":["GR-Gaussian: Graph-Based Radiative Gaussian Splatting for Sparse-View Tomographic Reconstruction"],"prefix":"10.1109","volume":"12","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-5556-149X","authenticated-orcid":false,"given":"Yikuang","family":"Yuluo","sequence":"first","affiliation":[{"name":"Key Lab of Optoelectronic Technology and Systems, and Engineering Research Center of Industrial Computed Tomography Nondestructive Testing, Ministry of Education, Chongqing University, Chongqing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-8332-0377","authenticated-orcid":false,"given":"Kuan","family":"Shen","sequence":"additional","affiliation":[{"name":"Key Lab of Optoelectronic Technology and Systems, and Engineering Research Center of Industrial Computed Tomography Nondestructive Testing, Ministry of Education, Chongqing University, Chongqing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yue","family":"Ma","sequence":"additional","affiliation":[{"name":"Department of Computer Science and Engineering, The Hong Kong University of Science and Technology, Hong Kong, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0001-5737-1051","authenticated-orcid":false,"given":"Ao","family":"Wang","sequence":"additional","affiliation":[{"name":"Key Lab of Optoelectronic Technology and Systems, and Engineering Research Center of Industrial Computed Tomography Nondestructive Testing, Ministry of Education, Chongqing University, Chongqing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Tongtong","family":"Jin","sequence":"additional","affiliation":[{"name":"Key Lab of Optoelectronic Technology and Systems, and Engineering Research Center of Industrial Computed Tomography Nondestructive Testing, Ministry of Education, Chongqing University, Chongqing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2627-3077","authenticated-orcid":false,"given":"Yixing","family":"Huang","sequence":"additional","affiliation":[{"name":"Institute of Medical Technology, Peking University Health Science Center, Beijing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0000-8702-3069","authenticated-orcid":false,"given":"Fuquan","family":"Wang","sequence":"additional","affiliation":[{"name":"Key Lab of Optoelectronic Technology and Systems, and Engineering Research Center of Industrial Computed Tomography Nondestructive Testing, Ministry of Education, Chongqing University, Chongqing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1137\/1.9780898719277"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1364\/JOSAA.1.000612"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1177\/016173468400600107"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-43999-5_2"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52729.2023.02159"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV51070.2023.00963"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1145\/3503250"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-16446-0_42"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52733.2024.01062"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV48922.2021.00197"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1145\/3592433"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52733.2024.01839"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52733.2024.00512"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52733.2024.01952"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52733.2024.02045"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-73232-4_16"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.52202\/079017-1427"},{"key":"ref18","article-title":"X-ray tomographic datasets","author":"Society","year":"2024"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1126\/science.6997993"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.compmedimag.2007.02.003"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.cirp.2014.05.011"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/3306346.3322965"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1088\/0031-9155\/53\/17\/021"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1088\/0031-9155\/40\/7\/006"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/78.193196"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2018.00664"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/IVMSPW.2018.8448403"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ICCV51070.2023.00983"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1364\/JOSAA.375595"},{"key":"ref30","first-page":"5057","article-title":"Micro-macro wavelet-based gaussian splatting for 3D reconstruction from unconstrained images","volume-title":"Proc. AAAI Conf. Artif. Intell.","volume":"39","author":"Li","year":"2025"},{"issue":"5","key":"ref31","first-page":"5236","article-title":"Decoupling appearance variations with 3D consistent features in Gaussian splatting","volume-title":"Proc. AAAI Conf. Artif. Intell.","volume":"39","author":"Lin","year":"2025"},{"issue":"4","key":"ref32","first-page":"3536","article-title":"BloomScene: Lightweight structured 3D Gaussian splatting for crossmodal scene generation","volume-title":"Proc. AAAI Conf. Artif. Intell.","volume":"39","author":"Hou","year":"2025"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v39i10.33193"},{"issue":"4","key":"ref34","first-page":"3644","article-title":"FatesGS: Fast and accurate sparse-view surface reconstruction using Gaussian splatting with depth-feature consistency","volume-title":"Proc. AAAI Conf. Artif. Intell.","volume":"39","author":"Huang","year":"2025"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52733.2024.01920"},{"issue":"6","key":"ref36","first-page":"6639","article-title":"HOGSA: Bimanual hand-object interaction understanding with 3D Gaussian splatting based data augmentation","volume-title":"Proc. AAAI Conf. Artif. Intell.","volume":"39","author":"Qu","year":"2025"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52733.2024.01864"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TCI.2025.3626239"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-031-72655-2_19"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TIP.2003.819861"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.5555\/3454287.3455008"},{"key":"ref42","article-title":"Fast graph representation learning with PyTorch geometric","author":"Fey","year":"2019"},{"key":"ref43","article-title":"Adam: A method for stochastic optimization","volume-title":"Proc. 3rd Int. Conf. Learn. Represent.","author":"Diederik","year":"2015"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR52734.2025.00074"}],"container-title":["IEEE Transactions on Computational Imaging"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/6745852\/11302051\/11609649.pdf?arnumber=11609649","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,7,15]],"date-time":"2026-07-15T20:15:46Z","timestamp":1784146546000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11609649\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026]]},"references-count":44,"URL":"https:\/\/doi.org\/10.1109\/tci.2026.3701585","relation":{},"ISSN":["2333-9403","2334-0118","2573-0436"],"issn-type":[{"value":"2333-9403","type":"electronic"},{"value":"2334-0118","type":"electronic"},{"value":"2573-0436","type":"print"}],"subject":[],"published":{"date-parts":[[2026]]}}}