{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,10]],"date-time":"2026-03-10T18:23:57Z","timestamp":1773167037778,"version":"3.50.1"},"reference-count":21,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2010,6,1]],"date-time":"2010-06-01T00:00:00Z","timestamp":1275350400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2010,6]]},"DOI":"10.1109\/tcsi.2009.2030096","type":"journal-article","created":{"date-parts":[[2010,1,7]],"date-time":"2010-01-07T14:19:19Z","timestamp":1262873959000},"page":"1166-1174","source":"Crossref","is-referenced-by-count":16,"title":["Combining the Standard Histogram Method and a Stimulus Identification Algorithm for A\/D Converter INL Testing With a Low-Quality Sine Wave Stimulus"],"prefix":"10.1109","volume":"57","author":[{"given":"Esa","family":"Korhonen","sequence":"first","affiliation":[]},{"given":"Carsten","family":"Wegener","sequence":"additional","affiliation":[]},{"given":"Juha","family":"Kostamovaara","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2008.920152"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2001.986167"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270843"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.847240"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2007.23"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2007.378992"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.908133"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2008.17"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/9780470545638"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.904491"},{"key":"ref4","year":"2007","journal-title":"The International Technology Roadmap for Semiconductors"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2009.2015200"},{"key":"ref6","year":"2008","journal-title":"IEEE Standard for Digitizing Waveform Recorders"},{"key":"ref5","year":"2001","journal-title":"IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.807415"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.855082"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2009.2019161"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2008.916451"},{"key":"ref9","first-page":"2103","article-title":"a high precision ramp generator for low cost adc test","author":"lee","year":"2008","journal-title":"Proc Int Solid State and Integrated Circuit Technology Conf"},{"key":"ref20","first-page":"184","article-title":"a simple method for linearity testing of adcs using non-linear test stimuli","author":"korhonen","year":"2007","journal-title":"Proc 13th Int Mixed Signals Testing Workshop 3rd Int GHz\/Gbps Test Workshop"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090928"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8919\/5482395\/05361353.pdf?arnumber=5361353","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,10]],"date-time":"2021-10-10T23:59:24Z","timestamp":1633910364000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5361353\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,6]]},"references-count":21,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2009.2030096","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,6]]}}}