{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2023,9,13]],"date-time":"2023-09-13T20:56:54Z","timestamp":1694638614505},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2010,8,1]],"date-time":"2010-08-01T00:00:00Z","timestamp":1280620800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2010,8]]},"DOI":"10.1109\/tcsi.2009.2039252","type":"journal-article","created":{"date-parts":[[2010,3,1]],"date-time":"2010-03-01T16:27:07Z","timestamp":1267460827000},"page":"2032-2040","source":"Crossref","is-referenced-by-count":11,"title":["Efficient Soft Error-Tolerant Adaptive Equalizers"],"prefix":"10.1109","volume":"57","author":[{"given":"P","family":"Reviriego","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J A","family":"Maestro","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Shih-Fu Liu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2006.874359"},{"key":"ref11","author":"haykin","year":"2002","journal-title":"Adaptive Filter Theory"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2008.924053"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/35.46671"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2008.920085"},{"key":"ref15","author":"kurzweil","year":"2000","journal-title":"An Introduction to Digital Communications"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/SBCCI.2002.1137643"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2007.4375149"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.826201"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2007.896072"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2004.839172"},{"key":"ref3","year":"0","journal-title":"The International Technology Roadmap for Semiconductors Update 2008"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ISIE.2007.4375147"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1984.1676475"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/23.903815"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/12.293265"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/12.59860"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.813129"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.892118"},{"key":"ref1","doi-asserted-by":"crossref","DOI":"10.1142\/5607","author":"schrimpf","year":"2004","journal-title":"Radiation Effects and Soft Errors in Integrated Circuits and Electronic Devices"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2001.1159296"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/35.46683"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/MCOM.1982.1090994"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCOM.1972.1091221"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1049\/el:19710089"},{"key":"ref26","author":"gonzalez","year":"2004","journal-title":"Single event upset simulation tool functional description"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2007.904688"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8919\/5545511\/05418885.pdf?arnumber=5418885","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T00:47:11Z","timestamp":1633913231000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5418885\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,8]]},"references-count":27,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2009.2039252","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,8]]}}}