{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,21]],"date-time":"2026-04-21T15:10:05Z","timestamp":1776784205068,"version":"3.51.2"},"reference-count":22,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"8","license":[{"start":{"date-parts":[[2010,8,1]],"date-time":"2010-08-01T00:00:00Z","timestamp":1280620800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2010,8]]},"DOI":"10.1109\/tcsi.2010.2041505","type":"journal-article","created":{"date-parts":[[2010,3,1]],"date-time":"2010-03-01T16:27:07Z","timestamp":1267460827000},"page":"2053-2065","source":"Crossref","is-referenced-by-count":35,"title":["Ground-Bouncing-Noise-Aware Combinational MTCMOS Circuits"],"prefix":"10.1109","volume":"57","author":[{"family":"Hailong Jiao","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V","family":"Kursun","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2006.876463"},{"key":"ref11","first-page":"362","article-title":"characterization of wake-up delay versus sleep mode power consumption and sleep\/active mode transition energy overhead tradeoffs in mtcmos circuits","author":"liu","year":"2008","journal-title":"Proc IEEE Int Midwest Symp Circuits Syst"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2006.882218"},{"key":"ref13","author":"kumar","year":"2008","journal-title":"Temperature adaptive and variation tolerant CMOS circuits"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ASQED.2009.5206297"},{"key":"ref15","first-page":"534","article-title":"ground bouncing noise aware sequential mtcmos circuits with data retention capability","author":"jiao","year":"2009","journal-title":"Proc IEEE Int Symp Integr Circuits"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2006.882206"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2007.894414"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2005.849026"},{"key":"ref19","year":"0","journal-title":"UMC 90 Nanometer CMOS Technology"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2003.810785"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146943"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/LPE.2003.1231828"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.826335"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2008.85"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2007.894428"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/4.400426"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1002\/0470033371"},{"key":"ref9","author":"taur","year":"1998","journal-title":"Fundamentals of Modern VLSI Devices"},{"key":"ref20","year":"2003","journal-title":"Virtuoso Layout Editor User Guide"},{"key":"ref22","year":"0","journal-title":"MOSIS Ceramic Packages"},{"key":"ref21","year":"2008","journal-title":"HSPICE User Guide Simulation and Analysis"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8919\/5545511\/05418906.pdf?arnumber=5418906","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T01:36:11Z","timestamp":1633916171000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5418906\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,8]]},"references-count":22,"journal-issue":{"issue":"8"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2010.2041505","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,8]]}}}