{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,8,27]],"date-time":"2024-08-27T08:28:36Z","timestamp":1724747316789},"reference-count":45,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2010,5,1]],"date-time":"2010-05-01T00:00:00Z","timestamp":1272672000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2010,5]]},"DOI":"10.1109\/tcsi.2010.2046956","type":"journal-article","created":{"date-parts":[[2010,5,12]],"date-time":"2010-05-12T19:49:57Z","timestamp":1273693797000},"page":"956-969","source":"Crossref","is-referenced-by-count":22,"title":["Complex Oscillation-Based Test and Its Application to Analog Filters"],"prefix":"10.1109","volume":"57","author":[{"given":"Sergio","family":"Callegari","sequence":"first","affiliation":[]},{"given":"Fabio","family":"Pareschi","sequence":"additional","affiliation":[]},{"given":"Gianluca","family":"Setti","sequence":"additional","affiliation":[]},{"given":"Mani","family":"Soma","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/43.851994"},{"key":"ref38","author":"shiryaev","year":"1995","journal-title":"Probability"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2002.1015001"},{"key":"ref32","author":"di bernardo","year":"2007","journal-title":"Piecewise-Smooth Dynamical Systems Theory an Applications"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.2307\/2318254"},{"key":"ref30","author":"mccauley","year":"1992","journal-title":"Chaos Dynamics and Fractals An Algorithmic Approach to Deterministic Chaos"},{"key":"ref37","author":"johns","year":"1997","journal-title":"Analog Integrated Circuit Design"},{"key":"ref36","year":"2001","journal-title":"AnadigmDesigner IP Module Manual LibraryAnadigm A"},{"key":"ref35","author":"lasota","year":"1995","journal-title":"Chaos Fractals and Noise Stochastic Aspects of Dynamics"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2002.1015009"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2008.4541419"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.11"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2009.5118397"},{"key":"ref12","author":"gray","year":"2001","journal-title":"Analysis and Design of Analog Integrated Circuits"},{"key":"ref13","author":"sedra","year":"2007","journal-title":"Microelectronic Circuits"},{"key":"ref14","author":"vidyasagar","year":"1978","journal-title":"Nonlinear System Analysis"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.1996.563529"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.2000.812668"},{"key":"ref17","first-page":"491","article-title":"a new built-in self-test approach for d\/a and a\/d converters","author":"arabi","year":"1994","journal-title":"Proc IEEE Int Conf CAD"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2002.1009909"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/19.843056"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/IJCNN.1999.831591"},{"key":"ref4","author":"wang","year":"2006","journal-title":"VLSI Test Principles and Architectures Design for Testability"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1007\/BF01600066"},{"key":"ref3","author":"bushnell","year":"2000","journal-title":"Essentials of Electronic Testing for Digital Memory and Mixed-Signal VLSI Circuits"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511816321"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TNN.2004.832807"},{"key":"ref5","first-page":"226","article-title":"reuse of existing resources for analog bist of a switch capacitor filter","author":"cota","year":"2000","journal-title":"Proc Des Autom Test Eur Conf Exhib"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.1996.510896"},{"key":"ref7","year":"1999","journal-title":"Oscillation-based test method for testing an at least partially analog circuit"},{"key":"ref2","author":"burns","year":"2000","journal-title":"An Introduction to Mixed-Signal IC Test and Measurement"},{"key":"ref1","doi-asserted-by":"crossref","DOI":"10.1007\/1-4020-5315-0","author":"huertas snchez","year":"2006","journal-title":"Oscillation-Based Test in Mixed-Signal Circuits"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2002.1009909"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/81.668866"},{"key":"ref45","year":"1999","journal-title":"LMF100High Performance Dual Switched Capacitor Filter"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/81.915386"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/EDTC.1997.582381"},{"key":"ref24","author":"parker","year":"1991","journal-title":"Practical Numerical Algorithms for Chaotic Systems"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/EURDAC.1996.558211"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1002\/(SICI)1097-007X(199711\/12)25:6<561::AID-CTA987>3.0.CO;2-K"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2009.5012113"},{"key":"ref26","author":"devaney","year":"1989","journal-title":"An Introduction to Chaotic Dynamical Systems"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/4.222167"},{"key":"ref25","author":"fitzpatrick","year":"2006","journal-title":"Computational Physics An Introductory Course"},{"key":"ref43","first-page":"30","article-title":"a path sensitization technique for testing of switched capacitor circuits","author":"biswas","year":"2003","journal-title":"Proc 16th Int Conf VLSI Des"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/8919\/5467096\/05458092.pdf?arnumber=5458092","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,11]],"date-time":"2021-10-11T00:44:02Z","timestamp":1633913042000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5458092\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,5]]},"references-count":45,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2010.2046956","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2010,5]]}}}