{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,28]],"date-time":"2025-10-28T10:42:11Z","timestamp":1761648131929},"reference-count":36,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2014,6,1]],"date-time":"2014-06-01T00:00:00Z","timestamp":1401580800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2014,6]]},"DOI":"10.1109\/tcsi.2013.2290850","type":"journal-article","created":{"date-parts":[[2014,1,30]],"date-time":"2014-01-30T20:32:19Z","timestamp":1391113939000},"page":"1741-1754","source":"Crossref","is-referenced-by-count":5,"title":["Dynamic Variability Monitoring Using Statistical Tests for Energy Efficient Adaptive Architectures"],"prefix":"10.1109","volume":"61","author":[{"given":"Lionel","family":"Vincent","sequence":"first","affiliation":[]},{"given":"Edith","family":"Beigne","sequence":"additional","affiliation":[]},{"given":"Suzanne","family":"Lesecq","sequence":"additional","affiliation":[]},{"given":"Julien","family":"Mottin","sequence":"additional","affiliation":[]},{"given":"David","family":"Coriat","sequence":"additional","affiliation":[]},{"given":"Philippe","family":"Maurine","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.3182\/20110828-6-IT-1002.01706"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/4.553189"},{"key":"ref31","article-title":"Temperature and fast voltage on-chip monitoring using low-cost digital sensors","author":"vincent","year":"2013","journal-title":"Proc 4th VARI"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228568"},{"key":"ref36","author":"durand","year":"2011","journal-title":"Reduction of the Energy Consumption in Embedded Electronic Devices with Low Control Computational Cost"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/FTFC.2012.6231736"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2008.4681811"},{"key":"ref10","first-page":"103","article-title":"Closed-loop adaptive voltage scaling controller for standard-cell asics","author":"dhar","year":"2002","journal-title":"Proc ISLPED"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2211671"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2009.4798265"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2160001"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.870912"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2007.375138"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2011.5763052"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.852041"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTS.2000.844416"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/VLSISOC.2009.6041336"},{"key":"ref28","first-page":"680","article-title":"Temperature effect on delay for low voltage applications","author":"daga","year":"1998","journal-title":"Proc DATE"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.885064"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.jsv.2009.07.004"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2036628"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/2024724.2024748"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364426"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.825120"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.838021"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2007.164"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/4.982424"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2007.09.001"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/4.881202"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2007145"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2007.4488534"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2003.159781"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/NEWCAS.2011.5981331"},{"key":"ref23","first-page":"994","article-title":"Embedding statistical tests for on-chip dynamic voltage and temperature monitoring","author":"vincent","year":"2012","journal-title":"Proc ACM\/EDAC\/IEEE DAC"},{"key":"ref26","doi-asserted-by":"crossref","first-page":"615","DOI":"10.1093\/mnras\/202.3.615","article-title":"Two-dimensional goodness-of-fit testing in astronomy","volume":"202","author":"peacock","year":"1983","journal-title":"Monthly Notices of the Royal Astronomical Society"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1201\/9781420036268"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8919\/6820808\/06728703.pdf?arnumber=6728703","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:18:19Z","timestamp":1642004299000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6728703\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,6]]},"references-count":36,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2013.2290850","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014,6]]}}}