{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,12]],"date-time":"2026-02-12T17:38:44Z","timestamp":1770917924761,"version":"3.50.1"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2014,12,1]],"date-time":"2014-12-01T00:00:00Z","timestamp":1417392000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2014,12]]},"DOI":"10.1109\/tcsi.2014.2327334","type":"journal-article","created":{"date-parts":[[2014,10,21]],"date-time":"2014-10-21T18:53:30Z","timestamp":1413917610000},"page":"3386-3393","source":"Crossref","is-referenced-by-count":22,"title":["Statistical Analysis of Read Static Noise Margin for Near\/Sub-Threshold SRAM Cell"],"prefix":"10.1109","volume":"61","author":[{"given":"Roghayeh","family":"Saeidi","sequence":"first","affiliation":[]},{"given":"Mohammad","family":"Sharifkhani","sequence":"additional","affiliation":[]},{"given":"Khosrow","family":"Hajsadeghi","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2011.2124531"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1987.1052809"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/2451916.2451927"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.873215"},{"key":"ref14","first-page":"79","author":"weste","year":"2010","journal-title":"CMOS VLSI Design A Circuits and Systems Perspective"},{"key":"ref15","year":"0","journal-title":"Predictive Technology Model Website"},{"key":"ref16","doi-asserted-by":"crossref","first-page":"1983","DOI":"10.1109\/TCAD.2008.2006096","article-title":"A statistical design-oriented delay variation model accounting for within-die variations","volume":"27","author":"abu-rahma","year":"2008","journal-title":"IEEE Trans Comput -Aided Des Integr Circuits Syst"},{"key":"ref17","author":"taur","year":"1998","journal-title":"Fundamentals of Modern VLSI Devices"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2008.4523217"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2160812"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DAC.2006.229167"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.883344"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2032698"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2008.4681834"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2001941"},{"key":"ref7","first-page":"602","article-title":"Analysis of process variation's effect on SRAM's read stability","author":"tsai","year":"2006","journal-title":"Proc Int Symp Quality Electron Design"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/4.913744"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.914328"},{"key":"ref9","first-page":"9","article-title":"Wordline & bitline pulsing schemes for improving SRAM cell stability in low-Vcc 65 nm CMOS designs","author":"khellah","year":"2006","journal-title":"Proc Symp VLSI Circuits"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2010818"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8919\/6964837\/06932492.pdf?arnumber=6932492","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:00:58Z","timestamp":1642003258000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6932492\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,12]]},"references-count":20,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2014.2327334","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014,12]]}}}