{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,27]],"date-time":"2026-02-27T15:32:14Z","timestamp":1772206334297,"version":"3.50.1"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2014,12,1]],"date-time":"2014-12-01T00:00:00Z","timestamp":1417392000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2014,12]]},"DOI":"10.1109\/tcsi.2014.2336511","type":"journal-article","created":{"date-parts":[[2014,10,17]],"date-time":"2014-10-17T18:56:17Z","timestamp":1413572177000},"page":"3407-3415","source":"Crossref","is-referenced-by-count":14,"title":["Efficient ECSM Characterization Considering Voltage, Temperature, and Mechanical Stress Variability"],"prefix":"10.1109","volume":"61","author":[{"given":"Baljit","family":"Kaur","sequence":"first","affiliation":[]},{"given":"Naushad","family":"Alam","sequence":"additional","affiliation":[]},{"given":"S. K.","family":"Manhas","sequence":"additional","affiliation":[]},{"given":"Bulusu","family":"Anand","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1146\/annurev-matsci-082908-145312"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2012.2184377"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2012.6187560"},{"key":"ref13","doi-asserted-by":"crossref","first-page":"946","DOI":"10.1007\/s11432-011-4224-9","article-title":"Advanced strain engineering for state-of-the-art nanoscale CMOS technology","volume":"54","author":"yang","year":"2011","journal-title":"Sci China Inf Sci"},{"key":"ref14","article-title":"The impact of process-induced mechanical stress on CMOS buffer design using multi-fingered devices","author":"alam","year":"2012","journal-title":"Microelectron Rel"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2210426"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2013.6523681"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/4.52187"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/EDL.1986.26422"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/MCD.2005.1438752"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/BMAS.2009.5338883"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1145\/299996.300007"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2012.6187549"},{"key":"ref27","first-page":"738","article-title":"Design and analysis of power distribution networks in PowerPC\/sup TM\/ microprocessors","author":"dharchoudhury","year":"1998","journal-title":"Proceedings 1998 Design and Automation Conference 35th DAC (Cat No 98CH36175) DAC"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2004.1382562"},{"key":"ref29","year":"2011"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775933"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146975"},{"key":"ref7","first-page":"363","article-title":"A waveform independent gate model for accurate timing analysis","author":"li","year":"2005","journal-title":"Proc IEEE Int Conf Comput Design VLSI Comput Processors"},{"key":"ref2","year":"2012"},{"key":"ref1","author":"mekhtarian","year":"0"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2009.2024945"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2004.837581"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.4313\/TEEM.2011.12.6.245"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1145\/1687399.1687496"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/4.953485"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2002.808156"},{"key":"ref26","author":"sze","year":"1981","journal-title":"Physics of Semiconductor Devices"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.895774"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8919\/6964837\/06928520.pdf?arnumber=6928520","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:00:58Z","timestamp":1642003258000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6928520"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,12]]},"references-count":29,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2014.2336511","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2014,12]]}}}