{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,6]],"date-time":"2026-06-06T14:59:29Z","timestamp":1780757969439,"version":"3.54.1"},"reference-count":20,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2016,9,1]],"date-time":"2016-09-01T00:00:00Z","timestamp":1472688000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61322405"],"award-info":[{"award-number":["61322405"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61234002"],"award-info":[{"award-number":["61234002"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61306044"],"award-info":[{"award-number":["61306044"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61376033"],"award-info":[{"award-number":["61376033"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2016,9]]},"DOI":"10.1109\/tcsi.2016.2576643","type":"journal-article","created":{"date-parts":[[2016,8,24]],"date-time":"2016-08-24T19:08:03Z","timestamp":1472065683000},"page":"1370-1380","source":"Crossref","is-referenced-by-count":70,"title":["A 0.45 V, Nano-Watt 0.033% Line Sensitivity MOSFET-Only Sub-Threshold Voltage Reference With no Amplifiers"],"prefix":"10.1109","volume":"63","author":[{"given":"Zhangming","family":"Zhu","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jin","family":"Hu","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yutao","family":"Wang","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref10","first-page":"1","article-title":"A ?115 dB PSRR CMOS bandgap reference with a novel voltage self-regulating technique","author":"zhu","year":"0","journal-title":"Proc CICC"},{"key":"ref11","first-page":"1","article-title":"A low-voltage process corner insensitive subthreshold CMOS voltage reference circuit","author":"lin","year":"0","journal-title":"Proc ICICDT"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2021922"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cds.2011.0170"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1977.1050882"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.899077"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ICASIC.2007.4415683"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2007.378348"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2361766"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2340576"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1049\/el.2013.3417"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2252523"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2014.2350354"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2013.2249131"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2015.2415292"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2092997"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2285371"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"440","DOI":"10.1109\/TCSII.2010.2048360","article-title":"A sub-200-mV voltage-scalable SRAM with tolerance of access failure by self-activated bitline sensing","volume":"57","author":"luo","year":"2010","journal-title":"IEEE Trans Circuits Syst II Express Briefs"},{"key":"ref9","first-page":"278","article-title":"A 210 nW 29.3 ppm\/&#x00B0;C 0.7 V voltage reference with a temperature range of ?50 to 130 &#x00B0;C in 0.13 $\\mu\\text{m}$ CMOS","author":"lee","year":"0","journal-title":"Proc VLSI Symp"},{"key":"ref20","doi-asserted-by":"crossref","first-page":"613","DOI":"10.1109\/TCSII.2016.2530096","article-title":"A resistorless low-power voltage reference","volume":"63","author":"k","year":"2016","journal-title":"IEEE Trans Circuits Syst II Express Briefs"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8919\/7559957\/07548334.pdf?arnumber=7548334","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:02:39Z","timestamp":1642003359000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7548334\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2016,9]]},"references-count":20,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2016.2576643","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2016,9]]}}}