{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,12]],"date-time":"2026-05-12T16:57:42Z","timestamp":1778605062312,"version":"3.51.4"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2017,7,1]],"date-time":"2017-07-01T00:00:00Z","timestamp":1498867200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"Andalusian Government","award":["P0-TIC-5386"],"award-info":[{"award-number":["P0-TIC-5386"]}]},{"name":"Spanish Government","award":["TEC2011-28302"],"award-info":[{"award-number":["TEC2011-28302"]}]},{"name":"Spanish Government","award":["TEC2015-68448-R"],"award-info":[{"award-number":["TEC2015-68448-R"]}]},{"name":"European FEDER program"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2017,7]]},"DOI":"10.1109\/tcsi.2017.2662085","type":"journal-article","created":{"date-parts":[[2017,2,24]],"date-time":"2017-02-24T14:29:42Z","timestamp":1487946582000},"page":"1718-1729","source":"Crossref","is-referenced-by-count":24,"title":["Black-Box Calibration for ADCs With Hard Nonlinear Errors Using a Novel INL-Based Additive Code: A Pipeline ADC Case Study"],"prefix":"10.1109","volume":"64","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5272-5802","authenticated-orcid":false,"given":"Antonio J.","family":"Gines","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Eduardo J.","family":"Peralias","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Adoracion","family":"Rueda","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"crossref","first-page":"1378","DOI":"10.1109\/ISCAS.2005.1464853","article-title":"A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals","volume":"2","author":"jin","year":"2005","journal-title":"Proc IEEE Inter Symp Circuits Syst"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2015.7169324"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.851083"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2013.2248289"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/4.121557"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1587\/transfun.E93.A.415"},{"key":"ref16","volume":"cas 33","year":"0"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2010.2051062"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-011-9749-8"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/4.261994"},{"key":"ref4","doi-asserted-by":"crossref","first-page":"2366","DOI":"10.1109\/JSSC.2009.2024809","article-title":"A 12-Bit 200-MHz CMOS ADC","volume":"44","author":"razavi","year":"2009","journal-title":"IEEE J Solid-State Circuits"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2004.839534"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2194191"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2007.910645"},{"key":"ref8","doi-asserted-by":"crossref","first-page":"1100","DOI":"10.1049\/el:20020731","article-title":"digital-domain self-calibration technique for video-rate pipeline a\/d converters using gaussian white noise","volume":"38","author":"goes","year":"2002","journal-title":"Electronics Letters"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2015.2435071"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2004.1332793"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2003.821279"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2003.819167"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.1004571"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2252518"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.870788"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.910106"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ETW.2000.873779"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2007.908276"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2005.86"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8919\/7956380\/07864410.pdf?arnumber=7864410","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T11:38:43Z","timestamp":1641987523000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7864410\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,7]]},"references-count":26,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2017.2662085","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2017,7]]}}}