{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,10]],"date-time":"2026-06-10T16:13:23Z","timestamp":1781108003535,"version":"3.54.1"},"reference-count":44,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2018,1,1]],"date-time":"2018-01-01T00:00:00Z","timestamp":1514764800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"funder":[{"name":"NTU Research Scholarship"},{"name":"Singapore Agency of Science and Technology (A*Star) PSF Research Grant and the SUTD-ZJU Joint Research Grant"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2018,1]]},"DOI":"10.1109\/tcsi.2017.2714902","type":"journal-article","created":{"date-parts":[[2017,6,26]],"date-time":"2017-06-26T18:08:21Z","timestamp":1498500501000},"page":"353-365","source":"Crossref","is-referenced-by-count":22,"title":["Decision-Directed Retention-Failure Recovery With Channel Update for MLC NAND Flash Memory"],"prefix":"10.1109","volume":"65","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3063-3015","authenticated-orcid":false,"given":"Chaudhry Adnan","family":"Aslam","sequence":"first","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Yong Liang","family":"Guan","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Kui","family":"Cai","sequence":"additional","affiliation":[],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2612655"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2016.2617309"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2010.2046966"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2009.2026658"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/4.475701"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2016.2533498"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2004.839541"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.1962.1057683"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/JSAC.2014.140508"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2523759"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/24.52622"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/LCOMM.2016.2615016"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2012.6378623"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2280078"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/NVMSA.2015.7304359"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2015.7056062"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1145\/2699866"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.266"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSAC.2016.2603608"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2015.2453413"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2012.2222399"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ICC.2015.7248335"},{"key":"ref4","first-page":"243","article-title":"LDPC-in-SSD: Making advanced error correction codes work effectively in solid state drives","author":"zhao","year":"2013","journal-title":"Proc 11th USENIX Conf File Storage Technol (FAST)"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2267753"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ICC.2012.6364973"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ALLERTON.2015.7447074"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2015.04.003"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/APSIPA.2014.7041532"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2016.2545679"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ICICS.2015.7459820"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2010.2071990"},{"key":"ref9","article-title":"Mitigating stuck cell failures in MLC NAND flash memory via inferred erasure decoding","author":"aslam","year":"0","journal-title":"IEEE Trans Very Large Scale Integr (VLSI) Syst"},{"key":"ref1","first-page":"521","article-title":"Error patterns in MLC NAND flash memory: Measurement, characterization, and analysis","author":"cai","year":"2012","journal-title":"Proc IEEE Des Autom Test Europe Conf Exhib (DATE)"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2013.2295056"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ALLERTON.2015.7447073"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2013.053013.120733"},{"key":"ref42","author":"snyman","year":"2005","journal-title":"Practical Mathematical Optimization An Introduction to Basic Optimization Theory and Classical and New Gradient-Based Algorithms"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2016.2602359"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2016.2637913"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TIT.2009.2018336"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2015.49"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2013.2244361"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2012.2208462"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2160747"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8919\/8248584\/07959126.pdf?arnumber=7959126","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,1,12]],"date-time":"2022-01-12T16:28:00Z","timestamp":1642004880000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7959126\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,1]]},"references-count":44,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2017.2714902","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,1]]}}}