{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T12:05:12Z","timestamp":1740139512140,"version":"3.37.3"},"reference-count":49,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2018,3,1]],"date-time":"2018-03-01T00:00:00Z","timestamp":1519862400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2018,3,1]],"date-time":"2018-03-01T00:00:00Z","timestamp":1519862400000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2018,3,1]],"date-time":"2018-03-01T00:00:00Z","timestamp":1519862400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2018,3,1]],"date-time":"2018-03-01T00:00:00Z","timestamp":1519862400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000144","name":"NSF","doi-asserted-by":"publisher","award":["1421352"],"award-info":[{"award-number":["1421352"]}],"id":[{"id":"10.13039\/100000144","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100002418","name":"Intel","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100002418","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2018,3]]},"DOI":"10.1109\/tcsi.2017.2766073","type":"journal-article","created":{"date-parts":[[2017,11,13]],"date-time":"2017-11-13T19:14:01Z","timestamp":1510600441000},"page":"960-969","source":"Crossref","is-referenced-by-count":10,"title":["On Enhancing Reliability of Weak PUFs via Intelligent Post-Silicon Accelerated Aging"],"prefix":"10.1109","volume":"65","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-0905-3761","authenticated-orcid":false,"given":"Md Nazmul","family":"Islam","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9076-2727","authenticated-orcid":false,"given":"Vinay C.","family":"Patil","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8221-3824","authenticated-orcid":false,"given":"Sandip","family":"Kundu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2006.03.026"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.885683"},{"journal-title":"45 nm NCSU FreePDK","year":"2016","key":"ref33"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2017.8050881"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2006.876577"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2006.320885"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2005.846913"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2004.826844"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/16.711362"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-40349-1_5"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1147172"},{"key":"ref27","first-page":"493","article-title":"An analytical model for negative bias temperature instability","author":"kumar","year":"2006","journal-title":"Proc IEEE\/ACM Int Conf Comput -Aided Design"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/2765491.2765512"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2008.212"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"9","DOI":"10.1145\/1278480.1278484","article-title":"physical unclonable functions for device authentication and secret key generation","author":"suh","year":"2007","journal-title":"2007 44th ACM\/IEEE Design Automation Conference DAC"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2017.7951814"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2014.6855586"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2013.6581562"},{"key":"ref24","first-page":"1","article-title":"Theory and application of majority vote: From condorcet jury theorem to pattern recognition","author":"lam","year":"2000","journal-title":"Proc 2nd Int Conf Math Edu 21st Century Math Living"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2014.6855578"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2005.852523"},{"key":"ref25","first-page":"730","article-title":"Estimation of statistical variation in temporal nbti degradation and its impact on lifetime circuit performance","author":"kang","year":"2007","journal-title":"Proc IEEE\/ACM Int Conf Comput -Aided Design"},{"article-title":"Efficient fuzzy extractors for reconfigurable hardware","year":"2008","author":"b\u00f6sch","key":"ref10"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-04138-9_24"},{"journal-title":"Predictive Technology Model (PTM)","year":"2016","key":"ref40"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ISIT.2009.5205263"},{"key":"ref13","first-page":"302","article-title":"PUFKY: A fully functional PUF-based cryptographic key generator","author":"maes","year":"2012","journal-title":"Cryptographic Hardware and Embedded Systems—CHES"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2370531"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-15031-9_23"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.910961"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2015.7085443"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2014.6783361"},{"article-title":"Identification circuit and method for generating an identification bit using physical unclonable functions","year":"2013","author":"bucci","key":"ref19"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2014.6865541"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-40349-1_6"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2012.6341361"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2014.6757433"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2010.5513106"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.3390\/jlpea7010002"},{"journal-title":"Nangate open cell library","year":"2016","key":"ref49"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1137\/060651380"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.907999"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/101.261888"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1109\/SOI.2011.6081713"},{"journal-title":"International Technology Roadmap for Semiconductor (ITRS)","year":"2016","key":"ref47"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRev.32.110"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRev.32.97"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/16.543032"},{"key":"ref43","doi-asserted-by":"crossref","first-page":"101","DOI":"10.1109\/55.902845","article-title":"Physical origin of the excess thermal noise in short channel MOSFETs","volume":"22","author":"goo","year":"2001","journal-title":"IEEE Electron Device Lett"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/ieeexplore.ieee.org\/ielaam\/8919\/8293879\/8106654-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8919\/8293879\/08106654.pdf?arnumber=8106654","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,8]],"date-time":"2022-04-08T18:51:35Z","timestamp":1649443895000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/8106654\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,3]]},"references-count":49,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2017.2766073","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"type":"print","value":"1549-8328"},{"type":"electronic","value":"1558-0806"}],"subject":[],"published":{"date-parts":[[2018,3]]}}}