{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,5]],"date-time":"2026-03-05T15:39:32Z","timestamp":1772725172220,"version":"3.50.1"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2018,10,1]],"date-time":"2018-10-01T00:00:00Z","timestamp":1538352000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2018,10,1]],"date-time":"2018-10-01T00:00:00Z","timestamp":1538352000000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2018,10,1]],"date-time":"2018-10-01T00:00:00Z","timestamp":1538352000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2018,10,1]],"date-time":"2018-10-01T00:00:00Z","timestamp":1538352000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100000001","name":"National Science Foundation","doi-asserted-by":"publisher","award":["NSF-CNS-1615774"],"award-info":[{"award-number":["NSF-CNS-1615774"]}],"id":[{"id":"10.13039\/100000001","id-type":"DOI","asserted-by":"publisher"}]},{"name":"SRC","award":["2016-TS-2691"],"award-info":[{"award-number":["2016-TS-2691"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2018,10]]},"DOI":"10.1109\/tcsi.2018.2811643","type":"journal-article","created":{"date-parts":[[2018,3,14]],"date-time":"2018-03-14T18:17:57Z","timestamp":1521051477000},"page":"3459-3468","source":"Crossref","is-referenced-by-count":21,"title":["X-Point PUF: Exploiting Sneak Paths for a Strong Physical Unclonable Function Design"],"prefix":"10.1109","volume":"65","author":[{"ORCID":"https:\/\/orcid.org\/0000-0003-1642-3473","authenticated-orcid":false,"given":"Rui","family":"Liu","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9146-2192","authenticated-orcid":false,"given":"Pai-Yu","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xiaochen","family":"Peng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Shimeng","family":"Yu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2015.2397951"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2014.7001345"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1038\/srep12785"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2014.2385870"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2015.7140231"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2015.2496257"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2016.7495549"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2017.8050792"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2190369"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/22\/25\/254003"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2017.8268337"},{"key":"ref4","first-page":"9","article-title":"Physical unclonable functions for device authentication and secret key generation","author":"suh","year":"2007","journal-title":"Proc Design Autom Conf (DAC)"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2012.40"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2320516"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2013.6581556"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-74735-2_5"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2387353"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2013.2279798"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2335155"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TIFS.2014.2315743"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-658-06708-3_15"},{"key":"ref20","article-title":"PUFs at a glance","author":"r\u00fchrmair","year":"2014","journal-title":"Proc Design Autom Test Eur Conf Exhibition (DATE)"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2578720"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2016.2546199"},{"key":"ref24","year":"2017","journal-title":"International Technology Roadmap for Semiconductors"},{"key":"ref23","first-page":"494","article-title":"A 65 nm 1 Mb nonvolatile computing-in-memory ReRAM macro with sub-16 ns multiply-and-accumulate for binary DNN AI edge processors","author":"chen","year":"2018","journal-title":"IEEE Int Solid-State Circuits Conf (ISSCC) Dig Tech Papers"},{"key":"ref26","first-page":"5","article-title":"Microscopic understanding of the low resistance state retention in HfO2 and HfAlO based RRAM","author":"traor\u00e9","year":"2014","journal-title":"IEDM Tech Dig"},{"key":"ref25","first-page":"1","article-title":"Improvement of data retention in HfO2\/Hf 1T1R RRAM cell under low operating current","author":"chen","year":"2013","journal-title":"IEDM Tech Dig"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"https:\/\/ieeexplore.ieee.org\/ielaam\/8919\/8453271\/8316257-aam.pdf","content-type":"application\/pdf","content-version":"am","intended-application":"syndication"},{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8919\/8453271\/08316257.pdf?arnumber=8316257","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,4,8]],"date-time":"2022-04-08T18:51:35Z","timestamp":1649443895000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8316257\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,10]]},"references-count":28,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2018.2811643","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2018,10]]}}}