{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,12]],"date-time":"2026-05-12T16:56:04Z","timestamp":1778604964116,"version":"3.51.4"},"reference-count":24,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","license":[{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,6,1]],"date-time":"2019-06-01T00:00:00Z","timestamp":1559347200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61774038"],"award-info":[{"award-number":["61774038"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61574033"],"award-info":[{"award-number":["61574033"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004750","name":"Aeronautical Science Foundation of China","doi-asserted-by":"publisher","award":["2017436901"],"award-info":[{"award-number":["2017436901"]}],"id":[{"id":"10.13039\/501100004750","id-type":"DOI","asserted-by":"publisher"}]},{"name":"National Science and Technology Major Project of the Ministry of Science and Technology of China","award":["2018ZX01031101"],"award-info":[{"award-number":["2018ZX01031101"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2019,6]]},"DOI":"10.1109\/tcsi.2019.2893294","type":"journal-article","created":{"date-parts":[[2019,3,28]],"date-time":"2019-03-28T18:54:10Z","timestamp":1553799250000},"page":"2288-2297","source":"Crossref","is-referenced-by-count":25,"title":["A Wide-Voltage-Range Half-Path Timing Error-Detection System With a 9-Transistor Transition-Detector in 40-nm CMOS"],"prefix":"10.1109","volume":"66","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-5520-1326","authenticated-orcid":false,"given":"Weiwei","family":"Shan","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2645-9912","authenticated-orcid":false,"given":"Xinchao","family":"Shang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Xing","family":"Wan","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9794-8049","authenticated-orcid":false,"given":"Hao","family":"Cai","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7736-6487","authenticated-orcid":false,"given":"Chuan","family":"Zhang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8379-0321","authenticated-orcid":false,"given":"Jun","family":"Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2418713"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2749423"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2017.2735445"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373408"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2297176"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2284364"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2013.070"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1587\/transfun.E98.A.1406"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2013.6690999"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ASSCC.2017.8240252"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2220912"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2079410"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2089657"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2007148"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2652482"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2328658"},{"key":"ref2","doi-asserted-by":"crossref","first-page":"32","DOI":"10.1109\/JSSC.2008.2007145","article-title":"Razor II: In situ error detection and correction for PVT and SER tolerance","volume":"44","author":"blaauw","year":"2009","journal-title":"IEEE J Solid-State Circuits"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.870912"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2017.2670644"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870452"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2012.2190674"},{"key":"ref21","doi-asserted-by":"crossref","first-page":"8","DOI":"10.1109\/JSSC.2015.2473655","article-title":"A 16 nm all-digital auto-calibrating adaptive clock distribution for supply voltage droop tolerance across a wide operating range","volume":"51","author":"bowman","year":"2016","journal-title":"IEEE J Solid-State Circuits"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1989.100747"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2857836"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8919\/8715688\/08676060.pdf?arnumber=8676060","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T21:13:39Z","timestamp":1657746819000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8676060\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,6]]},"references-count":24,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2019.2893294","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2019,6]]}}}