{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T12:04:42Z","timestamp":1740139482923,"version":"3.37.3"},"reference-count":16,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,12,1]],"date-time":"2019-12-01T00:00:00Z","timestamp":1575158400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Taiwan Semiconductor Research Institute"},{"DOI":"10.13039\/501100004663","name":"Ministry of Science and Technology, Taiwan","doi-asserted-by":"publisher","award":["MOST 107-2218-E-006-034","MOST 108-2622-8-006-004-TE2","MOST 107-2514-S-006-008"],"award-info":[{"award-number":["MOST 107-2218-E-006-034","MOST 108-2622-8-006-004-TE2","MOST 107-2514-S-006-008"]}],"id":[{"id":"10.13039\/501100004663","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100007531","name":"Southern Taiwan Science Park","doi-asserted-by":"publisher","award":["AZ-13-05-28-107"],"award-info":[{"award-number":["AZ-13-05-28-107"]}],"id":[{"id":"10.13039\/501100007531","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Nuvoton Technology Corporation"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2019,12]]},"DOI":"10.1109\/tcsi.2019.2938242","type":"journal-article","created":{"date-parts":[[2019,9,19]],"date-time":"2019-09-19T19:57:37Z","timestamp":1568923057000},"page":"4582-4591","source":"Crossref","is-referenced-by-count":3,"title":["Single-Bin DFT-Based Digital Calibration Technique for CDAC in SAR ADCs"],"prefix":"10.1109","volume":"66","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9757-1410","authenticated-orcid":false,"given":"Shuenn-Yuh","family":"Lee","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8038-8943","authenticated-orcid":false,"given":"Chieh","family":"Tsou","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9081-1418","authenticated-orcid":false,"given":"Yu-Cheng","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2011.2177006"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2009.2035267"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/31.20217"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2015.2468918"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2720629"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.897157"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2771364"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2198350"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2163556"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2013.2252475"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2013.2291051"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2042254"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-62012-1"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2279571"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2211695"},{"journal-title":"Voltage-reference impact on total harmonic distortion Texas Instruments","year":"2016","author":"duenas","key":"ref9"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8919\/8922968\/08844980.pdf?arnumber=8844980","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,13]],"date-time":"2022-07-13T20:55:55Z","timestamp":1657745755000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8844980\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,12]]},"references-count":16,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2019.2938242","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"type":"print","value":"1549-8328"},{"type":"electronic","value":"1558-0806"}],"subject":[],"published":{"date-parts":[[2019,12]]}}}