{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,28]],"date-time":"2026-04-28T05:13:51Z","timestamp":1777353231838,"version":"3.51.4"},"reference-count":22,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"6","funder":[{"name":"Hong Kong Research Grants Council Areas of Excellence","award":["AoE\/P-404\/18-2"],"award-info":[{"award-number":["AoE\/P-404\/18-2"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2021,6]]},"DOI":"10.1109\/tcsi.2021.3064870","type":"journal-article","created":{"date-parts":[[2021,5,12]],"date-time":"2021-05-12T19:40:48Z","timestamp":1620848448000},"page":"2470-2480","source":"Crossref","is-referenced-by-count":66,"title":["Design of Soft-Error-Aware SRAM With Multi-Node Upset Recovery for Aerospace Applications"],"prefix":"10.1109","volume":"68","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9462-3537","authenticated-orcid":false,"given":"Soumitra","family":"Pal","sequence":"first","affiliation":[]},{"given":"Sayonee","family":"Mohapatra","sequence":"additional","affiliation":[]},{"given":"Wing-Hung","family":"Ki","sequence":"additional","affiliation":[]},{"given":"Aminul","family":"Islam","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2012.6292120"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2017.2728180"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2872507"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2016.2593590"},{"key":"ref14","doi-asserted-by":"crossref","DOI":"10.1016\/j.mejo.2020.104843","article-title":"Power optimized SRAM cell with high radiation hardened for aerospace applications","volume":"103","author":"prasad","year":"2020","journal-title":"Microelectron J"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2020.3042520"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2021.3061642"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cds.2019.0050"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2006.884788"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2942493"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2788439"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.3389\/feart.2016.00040"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2009.2032090"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2015.2410275"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.856487"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2879341"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2474408"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2019.2952397"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2014.2304658"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2955865"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.897148"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2019.113503"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8919\/9442414\/09429940.pdf?arnumber=9429940","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,10,14]],"date-time":"2021-10-14T00:53:10Z","timestamp":1634172790000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9429940\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,6]]},"references-count":22,"journal-issue":{"issue":"6"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2021.3064870","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,6]]}}}