{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,24]],"date-time":"2026-03-24T06:10:40Z","timestamp":1774332640711,"version":"3.50.1"},"reference-count":47,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2021,10,1]],"date-time":"2021-10-01T00:00:00Z","timestamp":1633046400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,10,1]],"date-time":"2021-10-01T00:00:00Z","timestamp":1633046400000},"content-version":"am","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2021,10]]},"DOI":"10.1109\/tcsi.2021.3100900","type":"journal-article","created":{"date-parts":[[2021,8,3]],"date-time":"2021-08-03T20:09:21Z","timestamp":1628021361000},"page":"4170-4181","source":"Crossref","is-referenced-by-count":33,"title":["Design of High-Reliability Memory Cell to Mitigate Single Event Multiple Node Upsets"],"prefix":"10.1109","volume":"68","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8593-7182","authenticated-orcid":false,"given":"Hongchen","family":"Li","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1486-6377","authenticated-orcid":false,"given":"Liyi","family":"Xiao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9665-1881","authenticated-orcid":false,"given":"Chunhua","family":"Qi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jie","family":"Li","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2015.03.014"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/4.121546"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2015.2490552"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2012.2191971"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2017.2728180"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2016.06.004"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1049\/el.2014.4374"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.883344"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2014.6873683"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2015.72"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2012.01.001"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2015.2449073"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2004.14"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2872507"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2012.2206814"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2019.01.005"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2016.2590426"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2043271"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2015.2456832"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.3906\/elk-1502-124"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/23.556880"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/4.818928"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/7298.946456"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2014.2304658"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.813131"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2518220"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2879341"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2015.2509983"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2255624"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2013.02.012"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2011.2177135"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1166\/jolpe.2010.1073"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt.2008.0099"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2900150"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2009.2032090"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2008.4681834"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2008.2000892"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3072034"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2012.6292120"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1987.1052809"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2016.2593590"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2011.2156435"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2016.11.006"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/UKSIM.2011.108"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2011.2167233"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1145\/1393921.1393954"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2011.2168425"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8919\/9551015\/09505252.pdf?arnumber=9505252","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,2,28]],"date-time":"2022-02-28T21:44:01Z","timestamp":1646084641000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9505252\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,10]]},"references-count":47,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2021.3100900","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2021,10]]}}}