{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,10,11]],"date-time":"2026-10-11T03:15:49Z","timestamp":1791688549069,"version":"4.3.4"},"reference-count":29,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"4","license":[{"start":{"date-parts":[[2022,4,1]],"date-time":"2022-04-01T00:00:00Z","timestamp":1648771200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,4,1]],"date-time":"2022-04-01T00:00:00Z","timestamp":1648771200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,4,1]],"date-time":"2022-04-01T00:00:00Z","timestamp":1648771200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Institute of Information and Communications Technology Planning and Evaluation (IITP) Grant by the Korean Government through MSIT","award":["2021-0-00871"],"award-info":[{"award-number":["2021-0-00871"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2022,4]]},"DOI":"10.1109\/tcsi.2021.3138092","type":"journal-article","created":{"date-parts":[[2022,1,4]],"date-time":"2022-01-04T20:30:07Z","timestamp":1641328207000},"page":"1494-1506","source":"Crossref","is-referenced-by-count":17,"title":["TSUNAMI: Triple Sparsity-Aware Ultra Energy-Efficient Neural Network Training Accelerator With Multi-Modal Iterative Pruning"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1783-5296","authenticated-orcid":false,"given":"Sangyeob","family":"Kim","sequence":"first","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2100-1024","authenticated-orcid":false,"given":"Juhyoung","family":"Lee","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6557-2083","authenticated-orcid":false,"given":"Sanghoon","family":"Kang","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5212-2072","authenticated-orcid":false,"given":"Donghyeon","family":"Han","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3598-3572","authenticated-orcid":false,"given":"Wooyoung","family":"Jo","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6661-4879","authenticated-orcid":false,"given":"Hoi-Jun","family":"Yoo","sequence":"additional","affiliation":[{"name":"School of Electrical Engineering, Korea Advanced Institute of Science and Technology (KAIST), Daejeon, South Korea"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870350"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310262"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2019.8662302"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC19947.2020.9062989"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.23919\/VLSIC.2019.8778006"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2019.8662447"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VLSICircuits18222.2020.9162795"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.23919\/VLSICircuits52068.2021.9492420"},{"key":"ref9","article-title":"Deep compression: Compressing deep neural network with pruning, trained quantization and Huffman coding","author":"Han","year":"2015","journal-title":"arXiv:1510.00149"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.5244\/C.31.115"},{"key":"ref11","first-page":"1","article-title":"Pruning convolutional neural networks for resource efficient transfer learning","volume-title":"Proc. ICLR","author":"Molchanov"},{"key":"ref12","article-title":"Google\u2019s neural machine translation system: Bridging the gap between human and machine translation","author":"Wu","year":"2016","journal-title":"arXiv:1609.08144"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2009.5206848"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/1869790.1869829"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2014.461"},{"key":"ref16","article-title":"Dynamic channel pruning: Feature boosting and suppression","author":"Gao","year":"2018","journal-title":"arXiv:1810.05331"},{"key":"ref17","first-page":"1","article-title":"Building efficient convnets using redundant feature pruning","volume-title":"Proc. ICLR","author":"Ayinde"},{"key":"ref18","first-page":"1","article-title":"Pruning filters for efficient convnets","volume-title":"Proc. ICLR","author":"Li"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2016.7783725"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1609\/aaai.v34i04.5954"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2018.8351398"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/AICAS.2019.8771617"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.2966243"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2020.2980022"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2735490"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3030663"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3108762"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3021397"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2021.3120417"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8919\/9745276\/09669119.pdf?arnumber=9669119","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,13]],"date-time":"2024-01-13T21:58:59Z","timestamp":1705183139000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9669119\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,4]]},"references-count":29,"journal-issue":{"issue":"4"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2021.3138092","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,4]]}}}