{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,26]],"date-time":"2026-03-26T14:24:32Z","timestamp":1774535072858,"version":"3.50.1"},"reference-count":38,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2022,5,1]],"date-time":"2022-05-01T00:00:00Z","timestamp":1651363200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,5,1]],"date-time":"2022-05-01T00:00:00Z","timestamp":1651363200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,5,1]],"date-time":"2022-05-01T00:00:00Z","timestamp":1651363200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100012166","name":"National Key Research and Development Program of China","doi-asserted-by":"publisher","award":["2018YFB1801600"],"award-info":[{"award-number":["2018YFB1801600"]}],"id":[{"id":"10.13039\/501100012166","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["61941103"],"award-info":[{"award-number":["61941103"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Shenzhen Research and Development Funds for Science and Technology","award":["JCYJ20180508152019687"],"award-info":[{"award-number":["JCYJ20180508152019687"]}]},{"DOI":"10.13039\/501100017582","name":"Beijing National Research Center for Information Science and Technology","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100017582","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2022,5]]},"DOI":"10.1109\/tcsi.2022.3150408","type":"journal-article","created":{"date-parts":[[2022,2,17]],"date-time":"2022-02-17T20:25:22Z","timestamp":1645129522000},"page":"2070-2083","source":"Crossref","is-referenced-by-count":27,"title":["A Low Complexity Moving Average Nested GMP Model for Digital Predistortion of Broadband Power Amplifiers"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-9542-8709","authenticated-orcid":false,"given":"Wenhua","family":"Chen","sequence":"first","affiliation":[{"name":"Department of Electronic Engineering, Tsinghua University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9523-9094","authenticated-orcid":false,"given":"Xin","family":"Liu","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Tsinghua University, Beijing, China"}]},{"given":"Jiaming","family":"Chu","sequence":"additional","affiliation":[{"name":"Shenzhen International Graduate School, Tsinghua University, Shenzhen, China"}]},{"given":"Huibo","family":"Wu","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Tsinghua University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4679-9722","authenticated-orcid":false,"given":"Zhenghe","family":"Feng","sequence":"additional","affiliation":[{"name":"Department of Electronic Engineering, Tsinghua University, Beijing, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6788-1656","authenticated-orcid":false,"given":"Fadhel M.","family":"Ghannouchi","sequence":"additional","affiliation":[{"name":"Intelligent RF Radio Laboratory (iRadio Lab), University of Calgary, Calgary, AB, Canada"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JMW.2020.3035541"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JMW.2020.3034648"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MMM.2009.934516"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MMM.2014.2356037"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2872465"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.2975532"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IEEE-IWS.2018.8400950"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2014.2360387"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/APMC.2005.1606491"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1017\/cbo9780511619960"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2007.895155"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2004.837380"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2017.2729513"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2003.822188"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2006.879264"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2006.883243"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2010.2049717"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2011.2110659"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ICCIC.2017.8524271"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/CDC.2013.6760659"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2012.2215740"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/IEEE-IWS.2013.6616813"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3008804"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3034825"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2008.2003529"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2014.2387853"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2016.2640318"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2019.2952763"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3109973"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2017.2671368"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/MWSYM.2017.8058922"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/APMC.2008.4957877"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TIE.2013.2270217"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2014.2365459"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/LMWC.2008.922132"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.1966.1098387"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2010.2047920"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/INMMIC.2010.5480126"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8919\/9763566\/09715719.pdf?arnumber=9715719","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,17]],"date-time":"2024-01-17T23:16:23Z","timestamp":1705533383000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9715719\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,5]]},"references-count":38,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2022.3150408","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2022,5]]}}}