{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,19]],"date-time":"2025-12-19T15:42:55Z","timestamp":1766158975501,"version":"3.37.3"},"reference-count":31,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2022,10,1]],"date-time":"2022-10-01T00:00:00Z","timestamp":1664582400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2022,10,1]],"date-time":"2022-10-01T00:00:00Z","timestamp":1664582400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,10,1]],"date-time":"2022-10-01T00:00:00Z","timestamp":1664582400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2022,10]]},"DOI":"10.1109\/tcsi.2022.3189389","type":"journal-article","created":{"date-parts":[[2022,7,14]],"date-time":"2022-07-14T19:37:30Z","timestamp":1657827450000},"page":"4177-4190","source":"Crossref","is-referenced-by-count":7,"title":["Model Order Reduction for Delayed PEEC Models With Guaranteed Accuracy and Observed Stability"],"prefix":"10.1109","volume":"69","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-1885-3269","authenticated-orcid":false,"given":"Lihong","family":"Feng","sequence":"first","affiliation":[{"name":"Max Planck Institute for Dynamics of Complex Technical Systems, Magdeburg, Germany"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9899-4450","authenticated-orcid":false,"given":"Luigi","family":"Lombardi","sequence":"additional","affiliation":[{"name":"Micron Semiconductor, Avezzano, Italy"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3362-4103","authenticated-orcid":false,"given":"Peter","family":"Benner","sequence":"additional","affiliation":[{"name":"Max Planck Institute for Dynamics of Complex Technical Systems, Magdeburg, Germany"}]},{"given":"Daniele","family":"Romano","sequence":"additional","affiliation":[{"name":"Department of Industrial and Information Engineering and Economics, UAq EMC Laboratory, University of L’Aquila, L’Aquila, Italy"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5433-6173","authenticated-orcid":false,"given":"Giulio","family":"Antonini","sequence":"additional","affiliation":[{"name":"Department of Industrial and Information Engineering and Economics, UAq EMC Laboratory, University of L’Aquila, L’Aquila, Italy"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/82.839662"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1137\/130932715"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1137\/1.9781611976083"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1515\/9783110498967"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2013.2295011"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/NEMO.2015.7414991"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2014.2368611"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1002\/9781119078388"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TADVP.2007.906240"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2011.2154335"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/43.712097"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2017.2779484"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.2016.2586057"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2019.2919909"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1002\/nme.6554"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.sysconle.2008.10.016"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1051\/m2an\/2021001"},{"key":"ref18","first-page":"1","article-title":"Stable macromodels for delayed PEEC models with error estimation","volume-title":"Proc. Int. Appl. Comput. Electromagn. Soc. (ACES) Symp.","author":"Feng"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1147\/rd.165.0470"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1973.1127927"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TMTT.1974.1128204"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1049\/iet-map.2018.5233"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TAP.2005.861580"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TADVP.2007.896000"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/81.739268"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ISEMC.1994.385629"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/22.641787"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/9780470544631"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-72983-7_5"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2020.3029448"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2008.2002118"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8919\/9904939\/09829855.pdf?arnumber=9829855","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T06:46:14Z","timestamp":1706769974000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9829855\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,10]]},"references-count":31,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2022.3189389","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"type":"print","value":"1549-8328"},{"type":"electronic","value":"1558-0806"}],"subject":[],"published":{"date-parts":[[2022,10]]}}}