{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,23]],"date-time":"2026-04-23T14:55:01Z","timestamp":1776956101066,"version":"3.51.4"},"reference-count":26,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,1,1]],"date-time":"2023-01-01T00:00:00Z","timestamp":1672531200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62021004"],"award-info":[{"award-number":["62021004"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62004052"],"award-info":[{"award-number":["62004052"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62022065"],"award-info":[{"award-number":["62022065"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62090043"],"award-info":[{"award-number":["62090043"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["U19A2053"],"award-info":[{"award-number":["U19A2053"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62161160309"],"award-info":[{"award-number":["62161160309"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2023,1]]},"DOI":"10.1109\/tcsi.2022.3211461","type":"journal-article","created":{"date-parts":[[2022,10,10]],"date-time":"2022-10-10T20:10:28Z","timestamp":1665432628000},"page":"166-175","source":"Crossref","is-referenced-by-count":14,"title":["An Energy-Efficient SAR ADC With a Coarse-Fine Bypass Window Technique"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-2586-3772","authenticated-orcid":false,"given":"Yi","family":"Shen","sequence":"first","affiliation":[{"name":"Shaanxi Key Laboratory of Integrated Circuits and Systems, School of Microelectronics, Xidian University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3503-2881","authenticated-orcid":false,"given":"Jian","family":"Liu","sequence":"additional","affiliation":[{"name":"Shaanxi Key Laboratory of Integrated Circuits and Systems, School of Microelectronics, Xidian University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4053-5897","authenticated-orcid":false,"given":"Chenxi","family":"Han","sequence":"additional","affiliation":[{"name":"Shaanxi Key Laboratory of Integrated Circuits and Systems, School of Microelectronics, Xidian University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Angyang","family":"Li","sequence":"additional","affiliation":[{"name":"Shaanxi Key Laboratory of Integrated Circuits and Systems, School of Microelectronics, Xidian University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-9942-0069","authenticated-orcid":false,"given":"Shubin","family":"Liu","sequence":"additional","affiliation":[{"name":"Shaanxi Key Laboratory of Integrated Circuits and Systems, School of Microelectronics, Xidian University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9296-535X","authenticated-orcid":false,"given":"Ruixue","family":"Ding","sequence":"additional","affiliation":[{"name":"Shaanxi Key Laboratory of Integrated Circuits and Systems, School of Microelectronics, Xidian University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7764-1928","authenticated-orcid":false,"given":"Zhangming","family":"Zhu","sequence":"additional","affiliation":[{"name":"Shaanxi Key Laboratory of Integrated Circuits and Systems, School of Microelectronics, Xidian University, Xi’an, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2048498"},{"key":"ref2","first-page":"1","article-title":"A 0.015 mm2 63 fJ\/conversion-step 10-bit 220 MS\/s SAR ADC with 1.5 b\/step redundancy and digital metastability correction","volume-title":"Proc. IEEE CICC","author":"Vitek"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2014.2304890"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2014.2340583"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2581177"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2728784"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2720629"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2846746"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2912504"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.2012329"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2214181"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2012.6330609"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2304733"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2742515"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2017.2747132"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2785349"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2217635"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2211696"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2617879"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2016.2547958"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2849008"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2819164"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2922726"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2352304"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.1986.1052648"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/JSEN.2018.2822666"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8919\/10025563\/09913787.pdf?arnumber=9913787","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,22]],"date-time":"2024-01-22T22:48:19Z","timestamp":1705963699000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9913787\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,1]]},"references-count":26,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2022.3211461","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,1]]}}}