{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T12:05:17Z","timestamp":1740139517246,"version":"3.37.3"},"reference-count":39,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2023,2,1]],"date-time":"2023-02-01T00:00:00Z","timestamp":1675209600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,2,1]],"date-time":"2023-02-01T00:00:00Z","timestamp":1675209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,2,1]],"date-time":"2023-02-01T00:00:00Z","timestamp":1675209600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100003977","name":"Israel Science Foundation","doi-asserted-by":"publisher","award":["2569\/21"],"award-info":[{"award-number":["2569\/21"]}],"id":[{"id":"10.13039\/501100003977","id-type":"DOI","asserted-by":"publisher"}]},{"name":"FNRS-F.R.S"},{"DOI":"10.13039\/100010663","name":"European Union","doi-asserted-by":"publisher","award":["724725"],"award-info":[{"award-number":["724725"]}],"id":[{"id":"10.13039\/100010663","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2023,2]]},"DOI":"10.1109\/tcsi.2022.3222176","type":"journal-article","created":{"date-parts":[[2022,11,28]],"date-time":"2022-11-28T19:39:35Z","timestamp":1669664375000},"page":"783-796","source":"Crossref","is-referenced-by-count":1,"title":["An In-Depth Evaluation of Externally Amplified Coupling (EAC) Attacks\u2014A Concrete Threat for Masked Cryptographic Implementations"],"prefix":"10.1109","volume":"70","author":[{"given":"Ofek","family":"Gur","sequence":"first","affiliation":[{"name":"Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Tomer","family":"Gross","sequence":"additional","affiliation":[{"name":"Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6947-4410","authenticated-orcid":false,"given":"Davide","family":"Bellizia","sequence":"additional","affiliation":[{"name":"ICTEAM\/ELEN\/Crypto Group, Université Catholique de Louvain, Ottignies-Louvain-la-Neuve, Belgium"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7444-0285","authenticated-orcid":false,"given":"Francois-Xavier","family":"Standaert","sequence":"additional","affiliation":[{"name":"ICTEAM\/ELEN\/Crypto Group, Université Catholique de Louvain, Ottignies-Louvain-la-Neuve, Belgium"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5591-5799","authenticated-orcid":false,"given":"Itamar","family":"Levi","sequence":"additional","affiliation":[{"name":"Faculty of Engineering, Bar-Ilan University, Ramat Gan, Israel"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1007\/s00145-010-9085-7"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/FCCM.2018.00016"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-64837-4_26"},{"key":"ref34","doi-asserted-by":"crossref","first-page":"8","DOI":"10.1109\/JSSC.2015.2473655","article-title":"A 16 nm all-digital auto-calibrating adaptive clock distribution for supply voltage droop tolerance across a wide operating range","volume":"51","author":"bowman","year":"2016","journal-title":"IEEE J Solid-State Circuits"},{"key":"ref15","first-page":"199","article-title":"Towards practical tools for side channel aware software engineering: ‘Grey box’ modelling for instruction leakages","author":"mccann","year":"2017","journal-title":"Proc 26th USENIX Secur Symp (USENIX Security)"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/JETCAS.2021.3074608"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2018.i3.89-120"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1145\/3240765.3240841"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-49890-3_10"},{"key":"ref30","first-page":"65","article-title":"How (not) to use Welch’s T-test in side-channel security evaluations","author":"standaert","year":"2018","journal-title":"Proc Int Conf Smart Card Res Adv Appl"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-29959-0_15"},{"key":"ref33","first-page":"105","article-title":"Towards sound and optimal leakage detection procedure","author":"ding","year":"2017","journal-title":"Proc Int Conf Smart Card Res Adv Appl"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2021.i2.136-158"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1007\/s13389-016-0120-y"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-38348-9_9"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-48405-1_26"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-64647-3_1"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2872567"},{"key":"ref16","first-page":"915","article-title":"Sweeping for leakage in masked circuit layouts","author":"balasch","year":"2020","journal-title":"Proc Design Autom Test Eur Conf Exhibition (DATE)"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2555810"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2019.i2.293-317"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2018.i2.123-148"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2702098"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2018.2819499"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-52153-4_6"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-45146-4_27"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-40349-1_1"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3005338"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2020.i1.152-174"},{"key":"ref28","first-page":"115","article-title":"A testing methodology for side-channel resistance validation","volume":"7","author":"goodwill","year":"2011","journal-title":"Proc NIST Non-Invasive Attack Test Workshop"},{"key":"ref27","article-title":"Test vector leakage assessment (TVLA) methodology in practice","volume":"20","author":"cooper","year":"2013","journal-title":"Proc Int Cryptograph Module Conf"},{"key":"ref29","first-page":"28","article-title":"The generalization of ‘STUDENTS’ problem when several different population variances are involved","volume":"34","author":"welch","year":"1947","journal-title":"Biometrika"},{"key":"ref8","first-page":"64","article-title":"On the cost of lazy engineering for masked software implementations","author":"balasch","year":"2014","journal-title":"Proc Int Conf Smart Card Res Adv Appl"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-29912-4_6"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2020.3022979"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.46586\/tches.v2019.i2.256-292"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s00145-018-9277-0"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1007\/11545262_12"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-540-30574-3_24"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8919\/10027800\/09964453.pdf?arnumber=9964453","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,2,21]],"date-time":"2023-02-21T00:05:00Z","timestamp":1676937900000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9964453\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,2]]},"references-count":39,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2022.3222176","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"type":"print","value":"1549-8328"},{"type":"electronic","value":"1558-0806"}],"subject":[],"published":{"date-parts":[[2023,2]]}}}