{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,8]],"date-time":"2026-07-08T15:59:28Z","timestamp":1783526368117,"version":"3.55.0"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"3","license":[{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,3,1]],"date-time":"2023-03-01T00:00:00Z","timestamp":1677628800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100000038","name":"Natural Sciences and Engineering Research Council of Canada","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100000038","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100004489","name":"Mathematics of Information Technology and Complex Systems","doi-asserted-by":"crossref","id":[{"id":"10.13039\/501100004489","id-type":"DOI","asserted-by":"crossref"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2023,3]]},"DOI":"10.1109\/tcsi.2022.3227802","type":"journal-article","created":{"date-parts":[[2022,12,15]],"date-time":"2022-12-15T19:56:06Z","timestamp":1671134166000},"page":"1017-1029","source":"Crossref","is-referenced-by-count":21,"title":["A Low-Offset VCO-Based Time-Domain Comparator Using a Phase Frequency Detector With Reduced Dead and Blind Zones"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0001-8402-2167","authenticated-orcid":false,"given":"Mahin","family":"Esmaeilzadeh","sequence":"first","affiliation":[{"name":"Department of Electrical Engineering, Polytechnique Montréal, Montréal, QC, Canada"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-2581-4479","authenticated-orcid":false,"given":"Yves","family":"Audet","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Polytechnique Montréal, Montréal, QC, Canada"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7476-7920","authenticated-orcid":false,"given":"Mohamed","family":"Ali","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Polytechnique Montréal, Montréal, QC, Canada"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4137-7272","authenticated-orcid":false,"given":"Mohamad","family":"Sawan","sequence":"additional","affiliation":[{"name":"Department of Electrical Engineering, Polytechnique Montréal, Montréal, QC, Canada"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2004.837247"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2021.3104215"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.2987692"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2525098"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2885554"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2950188"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2018.11.009"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2008.4523149"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2102590"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2862880"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/NEWCAS49341.2020.9159801"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2021.3119691"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2631299"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.11591\/ijece.v8i6.pp4120-4132"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1007\/s10470-017-1013-4"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2010.2087951"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1007\/s00542-019-04458-4"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2005.852421"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.803048"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2017.04.011"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2019.2904100"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2013.2239175"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2022.3208273"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/82.917794"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2020.3008260"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2012.2215792"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2017.02.002"},{"key":"ref28","volume-title":"International Technology Roadmap for Semiconductors (ITRS)","year":"2015"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1145\/1862891.1862892"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2005.855082"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8919\/10052778\/09987668.pdf?arnumber=9987668","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,2,1]],"date-time":"2024-02-01T06:34:09Z","timestamp":1706769249000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9987668\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,3]]},"references-count":30,"journal-issue":{"issue":"3"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2022.3227802","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,3]]}}}