{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,20]],"date-time":"2026-02-20T18:52:00Z","timestamp":1771613520451,"version":"3.50.1"},"reference-count":37,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"12","license":[{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,12,1]],"date-time":"2023-12-01T00:00:00Z","timestamp":1701388800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100004358","name":"Samsung Electronics Co., Ltd. Design tools","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100004358","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100003836","name":"IC Design Education Center","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100003836","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2023,12]]},"DOI":"10.1109\/tcsi.2023.3307611","type":"journal-article","created":{"date-parts":[[2023,9,6]],"date-time":"2023-09-06T17:40:21Z","timestamp":1694022021000},"page":"5316-5327","source":"Crossref","is-referenced-by-count":14,"title":["CMOS Clock-Gated Synchronous Up\/Down Counter With High-Speed Local Clock Generation and Compact Toggle Flip-Flop"],"prefix":"10.1109","volume":"70","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6612-6584","authenticated-orcid":false,"given":"Geonhwi","family":"Lee","sequence":"first","affiliation":[{"name":"Department of Semiconductor Display Engineering, Sungkyunkwan University, Suwon-si, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5763-4272","authenticated-orcid":false,"given":"Bomin","family":"Joo","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1077-7038","authenticated-orcid":false,"given":"Bai-Sun","family":"Kong","sequence":"additional","affiliation":[{"name":"Department of Electrical and Computer Engineering, Sungkyunkwan University, Suwon, South Korea"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/jsyst.2015.2469676"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/access.2017.2778504"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/jiot.2016.2579198"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/jiot.2017.2683200"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2014.2357057"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/icpcsi.2017.8392016"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/access.2020.2998851"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2013.2253155"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/sies.2016.7509440"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2019.2927408"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2012.2230587"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2020.3012980"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2019.2959486"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2015.2413133"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2020.2979319"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ats.2014.16"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/itc-asia.2019.00037"},{"key":"ref18","volume-title":"CMOS VLSI Design","author":"Harris","year":"2011"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/tc.2022.3187343"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/hpca.2005.33"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2007.914901"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/iscas.2011.5937626"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/mwscas.2013.6674675"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/access.2022.3207151"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/4.668984"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/4.938376"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2014.6757516"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2018.2863946"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2017.2777788"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2021.3077074"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2009.2025627"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2018.2875089"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/4.340417"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/4.845191"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/tvlsi.2021.3061921"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/iccd53106.2021.00021"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2021.3107684"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8919\/10363413\/10241984.pdf?arnumber=10241984","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,1,12]],"date-time":"2024-01-12T02:37:12Z","timestamp":1705027032000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10241984\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,12]]},"references-count":37,"journal-issue":{"issue":"12"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2023.3307611","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2023,12]]}}}