{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,2]],"date-time":"2026-06-02T18:13:04Z","timestamp":1780423984892,"version":"3.54.1"},"reference-count":42,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"5","license":[{"start":{"date-parts":[[2024,5,1]],"date-time":"2024-05-01T00:00:00Z","timestamp":1714521600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,5,1]],"date-time":"2024-05-01T00:00:00Z","timestamp":1714521600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,5,1]],"date-time":"2024-05-01T00:00:00Z","timestamp":1714521600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100002347","name":"German Federal Ministry of Education through the Project Scale4Edge","doi-asserted-by":"publisher","award":["16ME0134"],"award-info":[{"award-number":["16ME0134"]}],"id":[{"id":"10.13039\/501100002347","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/501100002347","name":"Project VE-HEP","doi-asserted-by":"publisher","award":["16KIS1339K"],"award-info":[{"award-number":["16KIS1339K"]}],"id":[{"id":"10.13039\/501100002347","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2024,5]]},"DOI":"10.1109\/tcsi.2024.3349928","type":"journal-article","created":{"date-parts":[[2024,1,11]],"date-time":"2024-01-11T18:30:32Z","timestamp":1704997832000},"page":"1978-1991","source":"Crossref","is-referenced-by-count":12,"title":["Machine Learning Methodologies to Predict the Results of Simulation-Based Fault Injection"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-6720-9066","authenticated-orcid":false,"given":"Li","family":"Lu","sequence":"first","affiliation":[{"name":"IHP-Leibniz-Institut für innovative Mikroelektronik, Frankfurt (Oder), Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-4413-0937","authenticated-orcid":false,"given":"Junchao","family":"Chen","sequence":"additional","affiliation":[{"name":"IHP-Leibniz-Institut für innovative Mikroelektronik, Frankfurt (Oder), Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9230-640X","authenticated-orcid":false,"given":"Markus","family":"Ulbricht","sequence":"additional","affiliation":[{"name":"IHP-Leibniz-Institut für innovative Mikroelektronik, Frankfurt (Oder), Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0267-0203","authenticated-orcid":false,"given":"Milos","family":"Krstic","sequence":"additional","affiliation":[{"name":"IHP-Leibniz-Institut für innovative Mikroelektronik, Frankfurt (Oder), Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.120"},{"issue":"2","key":"ref2","first-page":"171","article-title":"A survey on fault injection techniques","volume":"1","author":"Ziade","year":"2004","journal-title":"Int. Arab J. Inf. Technol."},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391679"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VDAT.2011.5783576"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2018.08.005"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2016.7477313"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2000.887182"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/OLT.2001.937810"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2011.58"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2008.4630080"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090716"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICRMS.2011.5979292"},{"key":"ref13","first-page":"1","article-title":"A methodology for stochastic fault simulation in vlsi processor architectures","volume-title":"Proc. MoBs","author":"Hesscot"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TNN.2008.2005605"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/tcad.2023.3331968"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3069664"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3147587"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3201431"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2023.3289325"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/DSN-S.2019.00021"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2019.8854423"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS50870.2020.9159751"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/NORCHIP.2019.8906974"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/AHS.2019.00007"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/MECO49872.2020.9134279"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2906155"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3076282"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3010743"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1007\/s40745-015-0040-1"},{"key":"ref30","volume-title":"Design Compiler","year":"2023"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1007\/s10479-005-5724-z"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TNNLS.2020.2978386"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/MSP.2012.2235192"},{"key":"ref34","article-title":"Semi-supervised classification with graph convolutional networks","author":"Kipf","year":"2016","journal-title":"arXiv:1609.02907"},{"key":"ref35","article-title":"Inductive representation learning on large graphs","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","volume":"30","author":"Hamilton"},{"key":"ref36","volume-title":"OpenCores","year":"2022"},{"key":"ref37","volume-title":"Incisive Functional Safety Simulator","year":"2021"},{"key":"ref38","article-title":"Deep graph library: A graph-centric, highly-performant package for graph neural networks","author":"Wang","year":"2019","journal-title":"arXiv:1909.01315"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1088\/1742-6596\/1168\/2\/022022"},{"key":"ref40","volume-title":"Machine Learning Yearning","author":"Ng","year":"2018"},{"key":"ref41","first-page":"5389","article-title":"Do ImageNet classifiers generalize to ImageNet?","volume-title":"Proc. Int. Conf. Mach. Learn.","author":"Recht"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/CVPR.2011.5995347"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8919\/10510354\/10390537.pdf?arnumber=10390537","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,5,3]],"date-time":"2024-05-03T19:21:20Z","timestamp":1714764080000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10390537\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,5]]},"references-count":42,"journal-issue":{"issue":"5"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2024.3349928","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,5]]}}}