{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,4]],"date-time":"2026-06-04T18:59:18Z","timestamp":1780599558725,"version":"3.54.1"},"reference-count":28,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"7","license":[{"start":{"date-parts":[[2024,7,1]],"date-time":"2024-07-01T00:00:00Z","timestamp":1719792000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,7,1]],"date-time":"2024-07-01T00:00:00Z","timestamp":1719792000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,7,1]],"date-time":"2024-07-01T00:00:00Z","timestamp":1719792000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Advantest through the Graduate School Intelligent Methods for Test and Reliability (GS-IMTR), University of Stuttgart"},{"name":"German Research Foundation (DFG) \u201cACCROSS: Approximate Computing aCROss the System Stack.\u201d"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2024,7]]},"DOI":"10.1109\/tcsi.2024.3397460","type":"journal-article","created":{"date-parts":[[2024,5,21]],"date-time":"2024-05-21T17:31:32Z","timestamp":1716312692000},"page":"3269-3281","source":"Crossref","is-referenced-by-count":5,"title":["Graph Attention Networks to Identify the Impact of Transistor Degradation on Circuit Reliability"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0009-0003-4704-9274","authenticated-orcid":false,"given":"Tarek","family":"Mohamed","sequence":"first","affiliation":[{"name":"Semiconductor Test and Reliability (STAR), University of Stuttgart, Stuttgart, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6629-4713","authenticated-orcid":false,"given":"Victor M.","family":"van Santen","sequence":"additional","affiliation":[{"name":"Chair of AI Processor Design, Technical University of Munich (TUM), Munich, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9932-6833","authenticated-orcid":false,"given":"Lilas","family":"Alrahis","sequence":"additional","affiliation":[{"name":"Center for Cyber Security, New York University Abu Dhabi, Abu Dhabi, United Arab Emirates"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-0782-0397","authenticated-orcid":false,"given":"Ozgur","family":"Sinanoglu","sequence":"additional","affiliation":[{"name":"Center for Cyber Security, New York University Abu Dhabi, Abu Dhabi, United Arab Emirates"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5649-3102","authenticated-orcid":false,"given":"Hussam","family":"Amrouch","sequence":"additional","affiliation":[{"name":"Semiconductor Test and Reliability (STAR), University of Stuttgart, Stuttgart, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2011.6131494"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2017.2717790"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-71752-4_3"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DAC18072.2020.9218757"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.2004.1260992"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2004.85"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2898006"},{"key":"ref8","first-page":"1","article-title":"Active management of timing guardband to save energy in POWER7","volume-title":"Proc. 44th Annu. IEEE\/ACM Int. Symp. Microarchitecture (MICRO)","author":"Lefurgy"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/2897937.2898082"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2019.2893017"},{"key":"ref11","article-title":"Semi-supervised classification with graph convolutional networks","author":"Kipf","year":"2017","journal-title":"arXiv:1609.02907"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1145\/3316781.3317838"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/1007730.1007733"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DAC18072.2020.9218515"},{"key":"ref15","first-page":"1","article-title":"A customized graph neural network model for guiding analog IC placement","volume-title":"Proc. IEEE\/ACM Int. Conf. Comput. Aided Design (ICCAD)","author":"Li"},{"key":"ref16","article-title":"Graph attention networks","author":"Velickovic","year":"2017","journal-title":"arXiv:1710.10903"},{"key":"ref17","first-page":"1","article-title":"Practical Bayesian optimization of machine learning algorithms","volume-title":"Proc. Adv. Neural Inf. Process. Syst.","author":"Snoek"},{"key":"ref18","article-title":"The CMA evolution strategy: A tutorial","author":"Hansen","year":"2023","journal-title":"arXiv:1604.00772"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2021.3107250"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2022.3197521"},{"key":"ref21","first-page":"83","article-title":"Graph neural networks: A powerful and versatile tool for advancing design, reliability, and security of ICs","volume-title":"Proc. 28th Asia South Pacific Design Autom. Conf. (ASP-DAC)","author":"Alrahis"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2016.04.006"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/irps48203.2023.10117751"},{"key":"ref24","article-title":"Fast graph representation learning with PyTorch geometric","author":"Fey","year":"2019","journal-title":"arXiv:1903.02428"},{"issue":"1","key":"ref25","first-page":"1929","article-title":"Dropout: A simple way to prevent neural networks from overfitting","volume":"15","author":"Srivastava","year":"2014","journal-title":"J. Mach. Learn. Res."},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.48550\/arXiv.1908.01878"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1067\/mod.2000.109032"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1989.100747"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8919\/10575936\/10535497.pdf?arnumber=10535497","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,6,29]],"date-time":"2024-06-29T05:13:33Z","timestamp":1719638013000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10535497\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,7]]},"references-count":28,"journal-issue":{"issue":"7"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2024.3397460","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,7]]}}}