{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,12]],"date-time":"2026-05-12T16:55:03Z","timestamp":1778604903140,"version":"3.51.4"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"11","license":[{"start":{"date-parts":[[2024,11,1]],"date-time":"2024-11-01T00:00:00Z","timestamp":1730419200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2024,11,1]],"date-time":"2024-11-01T00:00:00Z","timestamp":1730419200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,11,1]],"date-time":"2024-11-01T00:00:00Z","timestamp":1730419200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"National Key Research and Development Program of China","award":["2022YFC2404902"],"award-info":[{"award-number":["2022YFC2404902"]}]},{"DOI":"10.13039\/501100001809","name":"NSFC","doi-asserted-by":"publisher","award":["62174149"],"award-info":[{"award-number":["62174149"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2024,11]]},"DOI":"10.1109\/tcsi.2024.3429309","type":"journal-article","created":{"date-parts":[[2024,8,1]],"date-time":"2024-08-01T18:40:25Z","timestamp":1722537625000},"page":"5067-5080","source":"Crossref","is-referenced-by-count":23,"title":["Artificial Neural Network Based Calibration for a 12 b 250 MS\/s Pipelined-SAR ADC With Ring Amplifier in 40-nm CMOS"],"prefix":"10.1109","volume":"71","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-9874-8633","authenticated-orcid":false,"given":"Bin","family":"Liu","sequence":"first","affiliation":[{"name":"Department of Microelectronics, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5675-2496","authenticated-orcid":false,"given":"Nannan","family":"Li","sequence":"additional","affiliation":[{"name":"Department of Microelectronics, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-7748-4653","authenticated-orcid":false,"given":"Xuhui","family":"Chen","sequence":"additional","affiliation":[{"name":"Research and Development Department, Qingdao Hi-Image Technologies Company Ltd., Qingdao, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0006-0484-7585","authenticated-orcid":false,"given":"Zhichao","family":"Dai","sequence":"additional","affiliation":[{"name":"Research and Development Department, Qingdao Hi-Image Technologies Company Ltd., Qingdao, China"}]},{"ORCID":"https:\/\/orcid.org\/0009-0004-6528-8751","authenticated-orcid":false,"given":"Yufeng","family":"Ge","sequence":"additional","affiliation":[{"name":"Department of Microelectronics, Xi’an Jiaotong University, Xi’an, China"}]},{"given":"Zheng","family":"Jiang","sequence":"additional","affiliation":[{"name":"Research and Development Department, Qingdao Hi-Image Technologies Company Ltd., Qingdao, China"}]},{"given":"Huanhuan","family":"Qi","sequence":"additional","affiliation":[{"name":"Department of Microelectronics, Xi’an Jiaotong University, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7339-9281","authenticated-orcid":false,"given":"Jie","family":"Zhang","sequence":"additional","affiliation":[{"name":"Department of Microelectronics, Xi’an Jiaotong University, Xi’an, China"}]},{"given":"Jinfu","family":"Wang","sequence":"additional","affiliation":[{"name":"Research and Development Department, Xi’an Aerosemi Technology Company, Xi’an, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2178-8661","authenticated-orcid":false,"given":"Xiaofei","family":"Wang","sequence":"additional","affiliation":[{"name":"Department of Microelectronics, Xi’an Jiaotong University, Xi’an, China"}]},{"given":"Zhenhai","family":"Chen","sequence":"additional","affiliation":[{"name":"Engineering Technology Research Center of Intelligent Microsystems Anhui Province, Huangshan University, Huangshan, China"}]},{"given":"Yan","family":"Xue","sequence":"additional","affiliation":[{"name":"China Electronics Technology Group Corporation No.58 Research Institute, Wuxi, China"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2746-1846","authenticated-orcid":false,"given":"Hong","family":"Zhang","sequence":"additional","affiliation":[{"name":"Department of Microelectronics, Xi’an Jiaotong University, Xi’an, China"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2075310"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/isscc.2012.6177097"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2014.6945993"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2463094"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2017.7870466"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/CICC48029.2020.9075942"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.3015863"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2020.3037295"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3133829"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2012.2217865"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2453332"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2879923"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42614.2022.9731599"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2021.3053893"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2006.884231"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2032637"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2582861"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2018.8310274"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2014.2361339"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2073194"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2005.1493976"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC55480.2022.9911287"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/19.492802"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2020.3012386"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2019.8902873"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS51556.2021.9401089"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/APCCAS50809.2020.9301682"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS47672.2021.9531920"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/ICSICT49897.2020.9278271"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/ICSICT49897.2020.9278216"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS46773.2023.10181892"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS46773.2023.10181825"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS47672.2021.9531763"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2022.3201016"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.amc.2013.03.026"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2010.5617411"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TBCAS.2018.2819207"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2019.2926648"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3196743"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.23919\/VLSITechnologyandCir57934.2023.10185416"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8919\/10736145\/10620219.pdf?arnumber=10620219","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2024,12,20]],"date-time":"2024-12-20T19:15:53Z","timestamp":1734722153000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10620219\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,11]]},"references-count":40,"journal-issue":{"issue":"11"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2024.3429309","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2024,11]]}}}