{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T16:37:14Z","timestamp":1781887034135,"version":"3.54.5"},"reference-count":30,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"2","license":[{"start":{"date-parts":[[2025,2,1]],"date-time":"2025-02-01T00:00:00Z","timestamp":1738368000000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,2,1]],"date-time":"2025-02-01T00:00:00Z","timestamp":1738368000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,2,1]],"date-time":"2025-02-01T00:00:00Z","timestamp":1738368000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"MICIU\/AEI\/10","award":["0000DONOTUSETHIS0000.13039\/501100011033"],"award-info":[{"award-number":["0000DONOTUSETHIS0000.13039\/501100011033"]}]},{"name":"MI-CIU\/AEI\/10","award":["0000DONOTUSETHIS0000.13039\/501100011033"],"award-info":[{"award-number":["0000DONOTUSETHIS0000.13039\/501100011033"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2025,2]]},"DOI":"10.1109\/tcsi.2024.3458057","type":"journal-article","created":{"date-parts":[[2024,10,4]],"date-time":"2024-10-04T13:42:50Z","timestamp":1728049370000},"page":"661-670","source":"Crossref","is-referenced-by-count":5,"title":["A Comprehensive Approach to Improving the Thermal Reliability of RTN-Based PUFs"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0009-0000-5059-2348","authenticated-orcid":false,"given":"F.","family":"de Los Santos-Prieto","sequence":"first","affiliation":[{"name":"Instituto de Microelectrónica de Sevilla, IMSE, CNM (CSIC, Universidad de Sevilla), Seville, Spain"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0971-5825","authenticated-orcid":false,"given":"F. J.","family":"Rubio-Barbero","sequence":"additional","affiliation":[{"name":"Instituto de Microelectrónica de Sevilla, IMSE, CNM (CSIC, Universidad de Sevilla), Seville, Spain"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6247-3124","authenticated-orcid":false,"given":"R.","family":"Castro-Lopez","sequence":"additional","affiliation":[{"name":"Instituto de Microelectrónica de Sevilla, IMSE, CNM (CSIC, Universidad de Sevilla), Seville, Spain"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6260-6495","authenticated-orcid":false,"given":"E.","family":"Roca","sequence":"additional","affiliation":[{"name":"Instituto de Microelectrónica de Sevilla, IMSE, CNM (CSIC, Universidad de Sevilla), Seville, Spain"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-8682-2280","authenticated-orcid":false,"given":"F. V.","family":"Fernandez","sequence":"additional","affiliation":[{"name":"Instituto de Microelectrónica de Sevilla, IMSE, CNM (CSIC, Universidad de Sevilla), Seville, Spain"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-030-23781-3"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MSSC.2019.2923503"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-5040-5"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1063\/1.5079407"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2013.2279875"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS48785.2022.9937632"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS48228.2024.10529354"},{"key":"ref8","first-page":"P-TX.6-1","article-title":"Investigation on the amplitude coupling effect of random telegraph noise (RTN) in nanoscale FinFETs","volume-title":"Proc. IEEE Int. Rel. Phys. Symp. (IRPS)","author":"Guo"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2014.2370531"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1007\/s41635-017-0012-3"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/HST.2010.5513105"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2015.7357137"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1016\/j.aeue.2024.155147"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2015.7223695"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2021.3130606"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2011.09.002"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2003.811418"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1080\/00018738900101122"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2264816"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2022.3198383"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/ESSDERC.2018.8486855"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2021.3086448"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2012.09.015"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/SMACD55068.2022.9816287"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/SMACD58065.2023.10192247"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2014.6861194"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2881923"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-662-44874-8"},{"key":"ref29","first-page":"14","article-title":"Reducing bias and inefficiency in the selection algorithm","volume-title":"Proc. 2nd Int. Conf. Genet. Algorithms Appl.","author":"Baker"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1007\/BF00175354"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8919\/10857679\/10705353.pdf?arnumber=10705353","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,27]],"date-time":"2026-03-27T19:54:03Z","timestamp":1774641243000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10705353\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,2]]},"references-count":30,"journal-issue":{"issue":"2"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2024.3458057","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,2]]}}}