{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,3,26]],"date-time":"2026-03-26T09:48:27Z","timestamp":1774518507074,"version":"3.50.1"},"reference-count":55,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"1","license":[{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,1,1]],"date-time":"2025-01-01T00:00:00Z","timestamp":1735689600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2025,1]]},"DOI":"10.1109\/tcsi.2024.3458864","type":"journal-article","created":{"date-parts":[[2024,9,18]],"date-time":"2024-09-18T18:06:18Z","timestamp":1726682778000},"page":"228-240","source":"Crossref","is-referenced-by-count":4,"title":["Fanout-Based Reliability Model for SER Estimation in Combinational Circuits"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0009-0006-3927-9362","authenticated-orcid":false,"given":"Esfandiar","family":"Esmaieli","sequence":"first","affiliation":[{"name":"Electrical Engineering Department, Ferdowsi University of Mashhad, Mashhad, Iran"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-4868-546X","authenticated-orcid":false,"given":"Yasser","family":"Sedaghat","sequence":"additional","affiliation":[{"name":"Department of Computer Engineering, Dependable Distributed Embedded Systems (DDEmS) Laboratory, Ferdowsi University of Mashhad, Mashhad, Iran"}]},{"given":"Ali","family":"Peiravi","sequence":"additional","affiliation":[{"name":"Electrical Engineering Department, Ferdowsi University of Mashhad, Mashhad, Iran"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2011.5784522"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/7298.946456"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2255624"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.917591"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2019.11.006"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2012.2209249"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2023.115080"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2021.114110"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/1297666.1297674"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2018.2845911"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2010.07.154"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2014.043"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2008.4751833"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2005.862738"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2009.2034147"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.274"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2018.8474079"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2008.2009139"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2020.113871"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2017.2772267"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.3390\/technologies10010023"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2007.891036"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2018.8602855"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/MOCAST.2019.8741538"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED48828.2020.9137014"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3390\/technologies8010005"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2018.2865179"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-019-05791-2"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2014.2317180"},{"key":"ref30","first-page":"1","article-title":"Symbolic simulation of the propagation and filtering of transient faulty pulses","volume-title":"Proc. SELSE Workshop","author":"Zhang"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2006.64"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2006.143"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/OLT.2003.1214376"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2006.876104"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2422845"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2011.12.031"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TSUSC.2018.2886640"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED54688.2022.9806212"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2009.08.006"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2018.2807431"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2014.11.004"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2018.2859960"},{"key":"ref43","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2011.2161700"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/23.903813"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1049\/iet-cdt.2014.0157"},{"key":"ref46","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2019.2902505"},{"key":"ref47","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2017.2718517"},{"key":"ref48","doi-asserted-by":"publisher","DOI":"10.1145\/3035496"},{"key":"ref49","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-019-05796-x"},{"key":"ref50","doi-asserted-by":"publisher","DOI":"10.1007\/s10825-020-01631-1"},{"key":"ref51","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2886027"},{"key":"ref52","doi-asserted-by":"publisher","DOI":"10.1016\/j.vlsi.2022.07.006"},{"key":"ref53","doi-asserted-by":"publisher","DOI":"10.1109\/ACCESS.2024.3368512"},{"key":"ref54","volume-title":"Data Structures and Algorithms in C++","author":"Goodrich","year":"2011"},{"key":"ref55","volume-title":"Nangate 15nm Open Cell Library","year":"2014"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8919\/10836116\/10683731.pdf?arnumber=10683731","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,10]],"date-time":"2025-01-10T05:41:13Z","timestamp":1736487673000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10683731\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,1]]},"references-count":55,"journal-issue":{"issue":"1"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2024.3458864","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,1]]}}}