{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,19]],"date-time":"2026-06-19T16:13:08Z","timestamp":1781885588601,"version":"3.54.5"},"reference-count":27,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100001809","name":"National Natural Science Foundation of China","doi-asserted-by":"publisher","award":["62174030"],"award-info":[{"award-number":["62174030"]}],"id":[{"id":"10.13039\/501100001809","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2025,9]]},"DOI":"10.1109\/tcsi.2024.3521928","type":"journal-article","created":{"date-parts":[[2025,1,6]],"date-time":"2025-01-06T15:00:39Z","timestamp":1736175639000},"page":"4550-4559","source":"Crossref","is-referenced-by-count":5,"title":["A 870 ppm\/V 53 ppm\/ \u00b0 C 7 MHz Non-Trimmed RC Relaxation Oscillator Using Mixed-Signal Compensation Loop From - 40 <sup>\u2218<\/sup>C to 165 <sup>\u2218<\/sup>C"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0009-0007-4148-1989","authenticated-orcid":false,"given":"Jianlin","family":"Xia","sequence":"first","affiliation":[{"name":"School of Integrated Circuits, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-0813-6864","authenticated-orcid":false,"given":"Yongjia","family":"Li","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Weiyue","family":"Qu","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-6499-4353","authenticated-orcid":false,"given":"Zhongyuan","family":"Fang","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-1833-3538","authenticated-orcid":false,"given":"Jin","family":"Wu","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Feng","family":"Lin","sequence":"additional","affiliation":[{"name":"Central Semiconductor Manufacturing Corporation, Wuxi, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Encheng","family":"Zhu","sequence":"additional","affiliation":[{"name":"China Resources Microelectronics Ltd., Wuxi, China"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-3289-8877","authenticated-orcid":false,"given":"Weifeng","family":"Sun","sequence":"additional","affiliation":[{"name":"School of Integrated Circuits, Southeast University, Nanjing, China"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","volume-title":"Failure Mechanism Based Stress Test Qualification for Integrated Circuits in Automatic Application","year":"2023"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2010.2048732"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2018.2877927"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2020.2987681"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3067051"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731730"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/vlsicircuits18222.2020.9162832"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3121014"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2022.3142662"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2021.3135939"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42613.2021.9365795"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/isscc42615.2023.10067729"},{"key":"ref13","first-page":"60","article-title":"A 0.01 mm2 10 MHz RC frequency reference with a 1-point on-chip-trimmed inaccuracy of \u00b10.28% from -45 \u00b0C to 125 \u00b0C in 0.18 \u03bcm CMOS","volume-title":"IEEE Int. Solid-State Circuits Conf. (ISSCC) Dig. Tech. Papers","author":"An"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS58744.2024.10557878"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2016.2586178"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS46773.2023.10182024"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2004.1328241"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2013.2277984"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2016.2593705"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/4.142592"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2895288"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2012.2226500"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3097828"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2023.3326351"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2018.2882376"},{"key":"ref26","volume-title":"Integrated Circuits\u2014Measurement of Electromagnetic Immunity\u2014Part 1: General Conditions and Definitions","year":"2015"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TEMC.2017.2729781"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8919\/11143801\/10829504.pdf?arnumber=10829504","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,29]],"date-time":"2025-08-29T17:44:47Z","timestamp":1756489487000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10829504\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,9]]},"references-count":27,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2024.3521928","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,9]]}}}