{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,9]],"date-time":"2026-04-09T14:35:33Z","timestamp":1775745333315,"version":"3.50.1"},"reference-count":40,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"name":"Funding for School-Level Research Projects of Yancheng Institute of Technology","award":["xjr2024038"],"award-info":[{"award-number":["xjr2024038"]}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2025,9]]},"DOI":"10.1109\/tcsi.2025.3525470","type":"journal-article","created":{"date-parts":[[2025,1,9]],"date-time":"2025-01-09T15:23:47Z","timestamp":1736436227000},"page":"5092-5105","source":"Crossref","is-referenced-by-count":3,"title":["Multi-Estimator Framework for Robust FDI Attack Detection in Smart Grids"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-7764-095X","authenticated-orcid":false,"given":"Chao","family":"Zhang","sequence":"first","affiliation":[{"name":"School of Information Engineering, Yancheng Institute of Technology, Yancheng, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yunfeng","family":"Ma","sequence":"additional","affiliation":[{"name":"School of Physics and Electronic Engineering, Yancheng Teachers University, Yancheng, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.35833\/MPCE.2020.000827"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2021.3113772"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2019.2948015"},{"issue":"1","key":"ref4","first-page":"3","article-title":"Analysis of the cyber attack on the Ukrainian power grid","volume":"388","author":"Case","year":"2016","journal-title":"Electr. Inf. Sharing Anal. Center (E-ISAC)"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.26792\/rbed.v7n2.2020.75204"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2024.3449896"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2019.2896292"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSYST.2022.3171751"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TASE.2023.3236102"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1016\/j.automatica.2021.109517"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2024.3357523"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2022.3193989"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TII.2022.3165869"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2023.3348928"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TSP.2019.2926023"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TSTE.2022.3211706"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.apenergy.2023.122258"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2022.3204524"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2019.2897100"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2023.3235945"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2021.3129074"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2020.106418"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2020.2988352"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2022.3199187"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1016\/j.epsr.2022.107794"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2023.112565"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TPWRS.2020.3026951"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2019.2949998"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1016\/j.jisa.2020.102518"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1016\/j.ijcip.2022.100508"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/SEGE.2019.8859946"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TSG.2021.3103556"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/TCYB.2023.3255583"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1109\/TAC.2023.3347491"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1137\/18M1213488"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511804441"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TSMC.2024.3357497"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TAI.2024.3354688"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1214\/aos\/1176325632"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1145\/2939672.2939785"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8919\/11143801\/10835141.pdf?arnumber=10835141","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,3,27]],"date-time":"2026-03-27T19:54:16Z","timestamp":1774641256000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10835141\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,9]]},"references-count":40,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2025.3525470","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,9]]}}}