{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,8,29]],"date-time":"2025-08-29T04:40:06Z","timestamp":1756442406366,"version":"3.44.0"},"reference-count":45,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"9","license":[{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,9,1]],"date-time":"2025-09-01T00:00:00Z","timestamp":1756684800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100005046","name":"Natural Science Foundation of Heilongjiang Province","doi-asserted-by":"publisher","award":["LH-2023F015"],"award-info":[{"award-number":["LH-2023F015"]}],"id":[{"id":"10.13039\/501100005046","id-type":"DOI","asserted-by":"publisher"}]},{"name":"Aeronautical Science Foundation of China","award":["JZJJX20210009"],"award-info":[{"award-number":["JZJJX20210009"]}]},{"DOI":"10.13039\/501100012226","name":"Fundamental Research Funds for the Central Universities","doi-asserted-by":"publisher","award":["HIT.NSFJG202209"],"award-info":[{"award-number":["HIT.NSFJG202209"]}],"id":[{"id":"10.13039\/501100012226","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2025,9]]},"DOI":"10.1109\/tcsi.2025.3526378","type":"journal-article","created":{"date-parts":[[2025,1,17]],"date-time":"2025-01-17T13:44:07Z","timestamp":1737121447000},"page":"4723-4736","source":"Crossref","is-referenced-by-count":0,"title":["LVDE: A Lightweight Threshold Voltage Distribution Estimation Strategy for High-Performance 3-D Nand Flash Memory"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0009-0008-4241-3504","authenticated-orcid":false,"given":"Zhelong","family":"Piao","sequence":"first","affiliation":[{"name":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6353-1384","authenticated-orcid":false,"given":"Debao","family":"Wei","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0009-0008-1890-8689","authenticated-orcid":false,"given":"Huqi","family":"Xiang","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8220-7990","authenticated-orcid":false,"given":"Liyan","family":"Qiao","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7424-1008","authenticated-orcid":false,"given":"Xiyuan","family":"Peng","sequence":"additional","affiliation":[{"name":"School of Electronics and Information Engineering, Harbin Institute of Technology, Harbin, China"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2665781"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC49657.2024.10454296"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2017.2731813"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC42614.2022.9731640"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2697000"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/3224432"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2015.2413841"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2022.3184270"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2017.2713127"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2019.2959318"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.3030867"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2023.3238845"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO50266.2020.00048"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2023.3338474"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2020.3012646"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2010.2071990"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1145\/3473305"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2020.2981025"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/TR.2019.2893287"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2021.3091957"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2022.3214115"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/ASP-DAC58780.2024.10473972"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2015.7056062"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2020.3028349"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2023.3332888"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/TCOMM.2020.2974723"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2019.2897706"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1145\/3585075"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2023.3319638"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2024.3350986"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1145\/3620665.3640372"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2021.3062768"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1145\/3162616"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1145\/3491230"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS48203.2023.10118096"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1145\/3352460.3358311"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2022.3213585"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2024.3366902"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2022.3171176"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/TCE.2015.7150595"},{"volume-title":"Solid-state Reliability Assessment and Qualification Methodologies","year":"2019","key":"ref41"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2023.3240932"},{"key":"ref43","first-page":"1","article-title":"LaLDPC: Latency-aware LDPC for read performance improvement of solid state drives","volume-title":"Proc. 33rd Int. Conf. Massive Storage Syst. Technol. (MSST)","author":"Du"},{"key":"ref44","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2022.3155380"},{"key":"ref45","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2022.3177812"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8919\/11143801\/10844854.pdf?arnumber=10844854","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,8,29]],"date-time":"2025-08-29T04:23:06Z","timestamp":1756441386000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10844854\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,9]]},"references-count":45,"journal-issue":{"issue":"9"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2025.3526378","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"type":"print","value":"1549-8328"},{"type":"electronic","value":"1558-0806"}],"subject":[],"published":{"date-parts":[[2025,9]]}}}