{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,5]],"date-time":"2026-06-05T04:53:53Z","timestamp":1780635233845,"version":"3.54.1"},"reference-count":42,"publisher":"Institute of Electrical and Electronics Engineers (IEEE)","issue":"10","license":[{"start":{"date-parts":[[2025,10,1]],"date-time":"2025-10-01T00:00:00Z","timestamp":1759276800000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/creativecommons.org\/licenses\/by-nc-nd\/4.0\/"}],"funder":[{"DOI":"10.13039\/501100001659","name":"Deutsche Forschungsgemeinschaft","doi-asserted-by":"publisher","award":["434434223\u2013SFB 1461"],"award-info":[{"award-number":["434434223\u2013SFB 1461"]}],"id":[{"id":"10.13039\/501100001659","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":["IEEE Trans. Circuits Syst. I"],"published-print":{"date-parts":[[2025,10]]},"DOI":"10.1109\/tcsi.2025.3555234","type":"journal-article","created":{"date-parts":[[2025,4,18]],"date-time":"2025-04-18T13:40:06Z","timestamp":1744983606000},"page":"5559-5570","source":"Crossref","is-referenced-by-count":3,"title":["A Compact One-Transistor-Multiple-RRAM Characterization Platform"],"prefix":"10.1109","volume":"72","author":[{"ORCID":"https:\/\/orcid.org\/0009-0002-8625-2040","authenticated-orcid":false,"given":"Max","family":"Uhlmann","sequence":"first","affiliation":[{"name":"IHP GmbH–Leibniz Institute for High Performance Microelectronics, Frankfurt (Oder), Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9879-386X","authenticated-orcid":false,"given":"Milosz","family":"Krysik","sequence":"additional","affiliation":[{"name":"Fraunhofer IEG, Cottbus, Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0003-7733-8907","authenticated-orcid":false,"given":"Jianan","family":"Wen","sequence":"additional","affiliation":[{"name":"IHP GmbH–Leibniz Institute for High Performance Microelectronics, Frankfurt (Oder), Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9862-1419","authenticated-orcid":false,"given":"Max","family":"Frohberg","sequence":"additional","affiliation":[{"name":"IHP GmbH–Leibniz Institute for High Performance Microelectronics, Frankfurt (Oder), Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-5205-0398","authenticated-orcid":false,"given":"Andrea","family":"Baroni","sequence":"additional","affiliation":[{"name":"IHP GmbH–Leibniz Institute for High Performance Microelectronics, Frankfurt (Oder), Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-5260-7929","authenticated-orcid":false,"given":"Keerthi Dorai Swamy","family":"Reddy","sequence":"additional","affiliation":[{"name":"IHP GmbH–Leibniz Institute for High Performance Microelectronics, Frankfurt (Oder), Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7545-9420","authenticated-orcid":false,"given":"Eduardo","family":"P\u00e9rez","sequence":"additional","affiliation":[{"name":"IHP GmbH–Leibniz Institute for High Performance Microelectronics, Frankfurt (Oder), Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0009-0009-0393-2528","authenticated-orcid":false,"given":"Philip","family":"Ostrovskyy","sequence":"additional","affiliation":[{"name":"IHP GmbH–Leibniz Institute for High Performance Microelectronics, Frankfurt (Oder), Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-7231-6704","authenticated-orcid":false,"given":"Krzysztof","family":"Piotrowski","sequence":"additional","affiliation":[{"name":"IHP GmbH–Leibniz Institute for High Performance Microelectronics, Frankfurt (Oder), Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-9147-0160","authenticated-orcid":false,"given":"Corrado","family":"Carta","sequence":"additional","affiliation":[{"name":"IHP GmbH–Leibniz Institute for High Performance Microelectronics, Frankfurt (Oder), Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-3698-2635","authenticated-orcid":false,"given":"Christian","family":"Wenger","sequence":"additional","affiliation":[{"name":"IHP GmbH–Leibniz Institute for High Performance Microelectronics, Frankfurt (Oder), Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-2674-2240","authenticated-orcid":false,"given":"Gerhard","family":"Kahmen","sequence":"additional","affiliation":[{"name":"IHP GmbH–Leibniz Institute for High Performance Microelectronics, Frankfurt (Oder), Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/jproc.1998.658762"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/mcse.2017.31"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1145\/216585.216588"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/977091.977115"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2024.3373763"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1145\/359576.359579"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/mcas.2021.3092533"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/isscc49657.2024.10454395"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/tcsi.2021.3064189"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ojsscs.2022.3210152"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/jxcdc.2024.3381888"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2024.3387566"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JEDS.2019.2931769"},{"key":"ref14","doi-asserted-by":"crossref","DOI":"10.1016\/j.sse.2021.107961","article-title":"Advanced temperature dependent statistical analysis of forming voltage distributions for three different HfO2-based RRAM technologies","volume":"176","author":"P\u00e9rez","year":"2021","journal-title":"Solid-State Electron."},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/jproc.2020.3004543"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/access.2022.3223657"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/iedm13553.2020.9372019"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/newcas57931.2023.10198073"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/tct.1971.1083337"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1038\/nature06932"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/jproc.2023.3273520"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/jproc.2023.3268092"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10091063"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/metroxraine58569.2023.10405805"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/icmts.2014.6841463"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2015.2433676"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1145\/3607888.3608608"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/iirw53245.2021.9635613"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1088\/2634-4386\/ac2cd4"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1063\/1.3624472"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/jproc.2012.2190369"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1149\/09204.0211ecst"},{"key":"ref33","doi-asserted-by":"publisher","DOI":"10.1109\/ted.2021.3072868"},{"key":"ref34","volume-title":"CMOS Analog Circuit Design","author":"Allen","year":"2016"},{"key":"ref35","volume-title":"Design of Analog CMOS Integrated Circuits","author":"Razavi","year":"2001"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1088\/0957-4484\/16\/10\/047"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1063\/1.2959065"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1063\/1.3081401"},{"key":"ref39","doi-asserted-by":"publisher","DOI":"10.1109\/led.2009.2039694"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1109\/relphy.2007.369875"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10060645"},{"key":"ref42","doi-asserted-by":"publisher","DOI":"10.1109\/tdmr.2022.3182133"}],"container-title":["IEEE Transactions on Circuits and Systems I: Regular Papers"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/8919\/11174046\/10970101.pdf?arnumber=10970101","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,10,2]],"date-time":"2025-10-02T04:34:08Z","timestamp":1759379648000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10970101\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,10]]},"references-count":42,"journal-issue":{"issue":"10"},"URL":"https:\/\/doi.org\/10.1109\/tcsi.2025.3555234","relation":{},"ISSN":["1549-8328","1558-0806"],"issn-type":[{"value":"1549-8328","type":"print"},{"value":"1558-0806","type":"electronic"}],"subject":[],"published":{"date-parts":[[2025,10]]}}}